Topotactic Metal-Insulator Transition in Epitaxial SrFeOx Thin Films

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Title
Topotactic Metal-Insulator Transition in Epitaxial SrFeOx Thin Films
Author(s)
Amit Khare; Dongwon Shin; Tae Sup Yoo; Minu Kim; Tae Dong Kang; Jaekwang Lee; Seulki Roh; In-Ho Jung; Jungseek Hwang; Sung Wng Kim; Tae Won Noh; Hiromichi Ohta; Woo Seok Choi
Publication Date
2017-10
Journal
ADVANCED MATERIALS, v.29, no.37, pp.1606566 -
Publisher
WILEY-V C H VERLAG GMBH
Abstract
Topotactic phase transformation enables structural transition without losing the crystalline symmetry of the parental phase and provides an effective platform for elucidating the redox reaction and oxygen diffusion within transition metal oxides. In addition, it enables tuning of the emergent physical properties of complex oxides, through strong interaction between the lattice and electronic degrees of freedom. In this communication, the electronic structure evolution of SrFeOx epitaxial thin films is identified in real-time, during the progress of reversible topotactic phase transformation. Using real-time optical spectroscopy, the phase transition between the two structurally distinct phases (i.e., brownmillerite and perovskite) is quantitatively monitored, and a pressure-temperature phase diagram of the topotactic transformation is constructed for the first time. The transformation at relatively low temperatures is attributed to a markedly small difference in Gibbs free energy compared to the known similar class of materials to date. This study highlights the phase stability and reversibility of SrFeOx thin films, which is highly relevant for energy and environmental applications exploiting the redox reactions. © 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
URI
https://pr.ibs.re.kr/handle/8788114/4022
ISSN
0935-9648
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > Journal Papers (저널논문)
Center for Correlated Electron Systems(강상관계 물질 연구단) > Journal Papers (저널논문)
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