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나노 구조 물리 연구단
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Depth resolved lattice-charge coupling in epitaxial BiFeO3 thin film

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Title
Depth resolved lattice-charge coupling in epitaxial BiFeO3 thin film
Author(s)
Hyeon Jun Lee; Sung Su Lee; Jeong Hun Kwak; Young-Min Kim; Hu Young Jeong; AlbinaY. Borisevich; Su Yong Lee; Do Young Noh; Owoong Kwon; Yunseok Kim; Ji Young Jo
Publication Date
2016-12
Journal
SCIENTIFIC REPORTS, v.6, no., pp.38724 -
Publisher
NATURE PUBLISHING GROUP
Abstract
For epitaxial films, a critical thickness (t(c)) can create a phenomenological interface between a strained bottom layer and a relaxed top layer. Here, we present an experimental report of how the t(c) in BiFeO3 thin films acts as a boundary to determine the crystalline phase, ferroelectricity, and piezoelectricity in 60 nm thick BiFeO3/SrRuO3/SrTiO3 substrate. We found larger Fe cation displacement of the relaxed layer than that of strained layer. In the time-resolved X-ray microdiffraction analyses, the piezoelectric response of the BiFeO3 film was resolved into a strained layer with an extremely low piezoelectric coefficient of 2.4 pm/V and a relaxed layer with a piezoelectric coefficient of 32 pm/V. The difference in the Fe displacements between the strained and relaxed layers is in good agreement with the differences in the piezoelectric coefficient due to the electromechanical coupling. © The Author(s) 2016
URI
http://pr.ibs.re.kr/handle/8788114/3209
DOI
10.1038/srep38724
ISSN
2045-2322
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > Journal Papers (저널논문)
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