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Depth resolved lattice-charge coupling in epitaxial BiFeO3 thin film

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dc.contributor.authorHyeon Jun Lee-
dc.contributor.authorSung Su Lee-
dc.contributor.authorJeong Hun Kwak-
dc.contributor.authorYoung-Min Kim-
dc.contributor.authorHu Young Jeong-
dc.contributor.authorAlbinaY. Borisevich-
dc.contributor.authorSu Yong Lee-
dc.contributor.authorDo Young Noh-
dc.contributor.authorOwoong Kwon-
dc.contributor.authorYunseok Kim-
dc.contributor.authorJi Young Jo-
dc.date.available2017-01-20T08:30:14Z-
dc.date.created2017-01-16-
dc.date.issued2016-12-
dc.identifier.issn2045-2322-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/3209-
dc.description.abstractFor epitaxial films, a critical thickness (t(c)) can create a phenomenological interface between a strained bottom layer and a relaxed top layer. Here, we present an experimental report of how the t(c) in BiFeO3 thin films acts as a boundary to determine the crystalline phase, ferroelectricity, and piezoelectricity in 60 nm thick BiFeO3/SrRuO3/SrTiO3 substrate. We found larger Fe cation displacement of the relaxed layer than that of strained layer. In the time-resolved X-ray microdiffraction analyses, the piezoelectric response of the BiFeO3 film was resolved into a strained layer with an extremely low piezoelectric coefficient of 2.4 pm/V and a relaxed layer with a piezoelectric coefficient of 32 pm/V. The difference in the Fe displacements between the strained and relaxed layers is in good agreement with the differences in the piezoelectric coefficient due to the electromechanical coupling. © The Author(s) 2016-
dc.description.uri1-
dc.language영어-
dc.publisherNATURE PUBLISHING GROUP-
dc.titleDepth resolved lattice-charge coupling in epitaxial BiFeO3 thin film-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000389490300001-
dc.identifier.scopusid2-s2.0-85006014549-
dc.identifier.rimsid58307ko
dc.date.tcdate2018-10-01-
dc.contributor.affiliatedAuthorYoung-Min Kim-
dc.identifier.doi10.1038/srep38724-
dc.identifier.bibliographicCitationSCIENTIFIC REPORTS, v.6, pp.38724-
dc.citation.titleSCIENTIFIC REPORTS-
dc.citation.volume6-
dc.citation.startPage38724-
dc.date.scptcdate2018-10-01-
dc.description.wostc1-
dc.description.scptc2-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusSTRAIN RELAXATION-
dc.subject.keywordPlusPOLARIZATION-
dc.subject.keywordPlusTHICKNESS-
dc.subject.keywordPlusINTERFACE-
dc.subject.keywordPlusFERROELECTRICITY-
dc.subject.keywordPlusGRADIENTS-
dc.subject.keywordPlusFIELD-
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > 1. Journal Papers (저널논문)
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Depth resolved_Young Min Kim_Scientific Reports.pdfDownload

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