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Terahertz, optical, and Raman signatures of monolayer graphene behavior in thermally reduced graphene oxide films

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Title: Terahertz, optical, and Raman signatures of monolayer graphene behavior in thermally reduced graphene oxide films

Author(s): Lim, J; Choi, K; Rani, JR; Jin-Seon Kim; Changgu Lee; Kim, JH; Jun, SC

Subject: Excitonic absorption, ; Fused silica substrates, ; Graphene oxide films, ; Reduced graphene oxides, ; Spectroscopic studies, ; Suitable conditions, ; Thermal reduction, ; Thermal-annealing, ; Atomic force microscopy, ; Graphene, ; Oxide films, ; Spectroscopic analysis, ; Topography, ; Monolayers

Abstract: We report on our joint spectroscopic study of the thermal reduction process of quasi-monolayer graphene oxide films grown on fused silica substrates by spin-coating. We estimate that about 65 of our film area consists of monolayer platelets of reduced graphene oxide, based on our quantitative analysis of the local atomic force microscopy topography. With thermal annealing under suitable conditions, clear signatures of monolayer graphene behavior were identified in the resonant excitonic absorption at 4.55 eV, the overall decrease in the visible-range transmission, the re-emergence of the Raman 2D band, the red-shift of the Raman G band toward the monolayer position, and the decrease in the optical sheet resistance in the terahertz range. © 2013 AIP Publishing LLC.