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Terahertz, optical, and Raman signatures of monolayer graphene behavior in thermally reduced graphene oxide films

DC Field Value Language
dc.contributor.authorLim, J-
dc.contributor.authorChoi, K-
dc.contributor.authorRani, JR-
dc.contributor.authorJin-Seon Kim-
dc.contributor.authorChanggu Lee-
dc.contributor.authorKim, JH-
dc.contributor.authorJun, SC-
dc.date.available2015-04-20T07:02:16Z-
dc.date.created2014-09-11ko
dc.date.issued2013-05-
dc.identifier.issn0021-8979-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/1338-
dc.description.abstractWe report on our joint spectroscopic study of the thermal reduction process of quasi-monolayer graphene oxide films grown on fused silica substrates by spin-coating. We estimate that about 65 of our film area consists of monolayer platelets of reduced graphene oxide, based on our quantitative analysis of the local atomic force microscopy topography. With thermal annealing under suitable conditions, clear signatures of monolayer graphene behavior were identified in the resonant excitonic absorption at 4.55 eV, the overall decrease in the visible-range transmission, the re-emergence of the Raman 2D band, the red-shift of the Raman G band toward the monolayer position, and the decrease in the optical sheet resistance in the terahertz range. © 2013 AIP Publishing LLC.-
dc.description.uri1-
dc.language영어-
dc.publisherAMER INST PHYSICS-
dc.subjectExcitonic absorption-
dc.subjectFused silica substrates-
dc.subjectGraphene oxide films-
dc.subjectReduced graphene oxides-
dc.subjectSpectroscopic studies-
dc.subjectSuitable conditions-
dc.subjectThermal reduction-
dc.subjectThermal-annealing-
dc.subjectAtomic force microscopy-
dc.subjectGraphene-
dc.subjectOxide films-
dc.subjectSpectroscopic analysis-
dc.subjectTopography-
dc.subjectMonolayers-
dc.titleTerahertz, optical, and Raman signatures of monolayer graphene behavior in thermally reduced graphene oxide films-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000319294100010-
dc.identifier.scopusid2-s2.0-84878031522-
dc.identifier.rimsid53178ko
dc.date.tcdate2018-10-01-
dc.contributor.affiliatedAuthorJin-Seon Kim-
dc.contributor.affiliatedAuthorChanggu Lee-
dc.identifier.doi10.1063/1.4803713-
dc.identifier.bibliographicCitationJOURNAL OF APPLIED PHYSICS, v.113, no.18, pp.183502-
dc.citation.titleJOURNAL OF APPLIED PHYSICS-
dc.citation.volume113-
dc.citation.number18-
dc.citation.startPage183502-
dc.date.scptcdate2018-10-01-
dc.description.wostc12-
dc.description.scptc15-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusSINGLE-LAYER GRAPHENE-
dc.subject.keywordPlusTHIN-FILMS-
dc.subject.keywordPlusLARGE-AREA-
dc.subject.keywordPlusCARBON NANOTUBES-
dc.subject.keywordPlusGRAPHITE OXIDE-
dc.subject.keywordPlusSPECTROSCOPY-
dc.subject.keywordPlusTRANSPARENT-
dc.subject.keywordPlusNANOSHEETS-
dc.subject.keywordPlusSUBSTRATE-
dc.subject.keywordPlusEVOLUTION-
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > 1. Journal Papers (저널논문)
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