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Mark Hermann Rummeli
나노구조물리 연구단
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A cheap and quickly adaptable in situ electrical contacting TEM sample holder design

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Title
A cheap and quickly adaptable in situ electrical contacting TEM sample holder design
Author(s)
Borrnert F.; Voigtlander R.; Rellinghaus B.; Buchner B.; Rummeli M.H.; Lichte H.
Publication Date
2014-04
Journal
ULTRAMICROSCOPY, v.139, no., pp.1 - 4
Publisher
ELSEVIER SCIENCE BV
Abstract
In situ electrical characterization of nanostructures inside a transmission electron microscope provides crucial insight into the mechanisms of functioning micro- and nano-electronic devices. For such in situ investigations specialized sample holders are necessary. A simple and affordable but flexible design is important, especially, when sample geometries change, a holder should be adaptable with minimum effort. Atomic resolution imaging is standard nowadays, so a sample holder must ensure this capability. A sample holder design for on-chip samples is presented that fulfils these requisites. On-chip sample devices have the advantage that they can be manufactured via standard fabrication routes. © 2014 Elsevier B.V.
URI
https://pr.ibs.re.kr/handle/8788114/1059
ISSN
0304-3991
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > Journal Papers (저널논문)
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