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나노구조물리연구단
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A cheap and quickly adaptable in situ electrical contacting TEM sample holder design

DC Field Value Language
dc.contributor.authorBorrnert F.-
dc.contributor.authorVoigtlander R.-
dc.contributor.authorRellinghaus B.-
dc.contributor.authorBuchner B.-
dc.contributor.authorRummeli M.H.-
dc.contributor.authorLichte H.-
dc.date.available2015-04-20T06:01:37Z-
dc.date.created2014-08-11-
dc.date.issued2014-04-
dc.identifier.issn0304-3991-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/1059-
dc.description.abstractIn situ electrical characterization of nanostructures inside a transmission electron microscope provides crucial insight into the mechanisms of functioning micro- and nano-electronic devices. For such in situ investigations specialized sample holders are necessary. A simple and affordable but flexible design is important, especially, when sample geometries change, a holder should be adaptable with minimum effort. Atomic resolution imaging is standard nowadays, so a sample holder must ensure this capability. A sample holder design for on-chip samples is presented that fulfils these requisites. On-chip sample devices have the advantage that they can be manufactured via standard fabrication routes. © 2014 Elsevier B.V.-
dc.description.uri1-
dc.language영어-
dc.publisherELSEVIER SCIENCE BV-
dc.subjectIn situ TEM,TEM sampleholder,Electrical contacting-
dc.titleA cheap and quickly adaptable in situ electrical contacting TEM sample holder design-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000332531400001-
dc.identifier.scopusid2-s2.0-84893458268-
dc.identifier.rimsid415ko
dc.date.tcdate2018-10-01-
dc.contributor.affiliatedAuthorRummeli M.H.-
dc.identifier.doi10.1016/j.ultramic.2014.01.001-
dc.identifier.bibliographicCitationULTRAMICROSCOPY, v.139, pp.1 - 4-
dc.citation.titleULTRAMICROSCOPY-
dc.citation.volume139-
dc.citation.startPage1-
dc.citation.endPage4-
dc.date.scptcdate2018-10-01-
dc.description.wostc1-
dc.description.scptc1-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordAuthorElectrical contacting-
dc.subject.keywordAuthorIn situ TEM-
dc.subject.keywordAuthorTEM sample holder-
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > 1. Journal Papers (저널논문)
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