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Publication Date2022-12
Precise Layer Control and Electronic State Modulation of a Transition Metal Dichalcogenide via Phase-Transition-Induced Growth
Sohn, Ahrum; Kim, Changhyun; Jung, Jae-Hwan, et al
ADVANCED MATERIALS, v.34, no.48
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Publication Date2022-05
Defect-gradient-induced Rashba effect in van der Waals PtSe2 layers
Jo, J.; Jung Hwa Kim; Choong Hyun Kim, et al
Nature Communications, v.13, no.1
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Publication Date2021-10-20
Elucidation of Novel Potassium-Mediated Oxidation and Etching of Two-Dimensional Transition Metal Dichalcogenides
Aram Yoon; Jung Hwa Kim; Zonghoon Lee
ACS Applied Materials and Interfaces, v.13, no.41, pp.49163 - 49171
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Publication Date2021-01-08
OH molecule-involved formation of point defects in monolayer graphene
Gyeong Hee Ryu; Sungwoo Lee; Jung Hwa Kim, et al
NANOTECHNOLOGY, v.32, no.2
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Publication Date2020-12
Spontaneous Formation of a ZnO Monolayer by the Redox Reaction of Zn on Graphene Oxide
Seungwoo Son; Yeonchoo Cho; Hyo-Ki Hong, et al
ACS APPLIED MATERIALS & INTERFACES, v.12, no.48, pp.54222 - 54229
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Publication Date2020-08
Antiphase Boundaries as Faceted Metallic Wires in 2D Transition Metal Dichalcogenides
Jung Hwa Kim; Se-Yang Kim; Sung O. Park, et al
ADVANCED SCIENCE, v.7, no.15, pp.2000788
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Publication Date2020-05
van der Waals Epitaxial Formation of Atomic Layered α-MoO3 on MoS2 by Oxidation
Aram Yoon; Jung Hwa Kim; Jongchan Yoon, et al
ACS APPLIED MATERIALS & INTERFACES, v.12, no.19, pp.22029 - 22036
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Publication Date2020-04
Wafer-scale production of patterned transition metal ditelluride layers for two-dimensional metal–semiconductor contacts at the Schottky–Mott limit
Seunguk Song; Yeoseon Sim; Se-Yang Kim, et al
Nature Electronics, v.3, no.4, pp.207 - 215
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Publication Date2020-04
Polytypism in few-layer gallium selenide
Soo Yeon Lim; Jae-Ung Lee; Jung Hwa Kim, et al
NANOSCALE, v.12, no.15, pp.8563 - 8573
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Publication Date2019-04
Dedicated preparation for in situ transmission electron microscope tensile testing of exfoliated graphene
Kim, Kangsik; Jong Chan Yoon; Jaemin Kim, et al
APPLIED MICROSCOPY, v.49, no.3, pp.1 - 7