BROWSE

Related Scientist

CCES's photo.

CCES
강상관계 물질 연구단
more info

ITEM VIEW & DOWNLOAD

root 2 x root 2R45 degrees surface reconstruction and electronic structure of BaSnO3 film

Cited 0 time in webofscience Cited 0 time in scopus
40 Viewed 0 Downloaded
Title
root 2 x root 2R45 degrees surface reconstruction and electronic structure of BaSnO3 film
Author(s)
Shoresh Soltani; Sungyun Hong; Bongju Kim; Donghan Kim; Jong Keun Jung; Byungmin Sohn; Tae Won Noh; Kookrin Char; Changyoung Kim
Subject
BAND-GAP, ; TRANSPARENT, ; MOBILITY
Publication Date
2020-05
Journal
PHYSICAL REVIEW MATERIALS, v.4, no.5, pp.055003
Publisher
AMER PHYSICAL SOC
Abstract
©2020 American Physical Society. We studied the surface and electronic structures of barium stannate (BaSnO3) thin films by low-energy electron diffraction (LEED) and angle-resolved photoemission spectroscopy (ARPES) techniques. BaSnO3/Ba0.96La0.04SnO3/SrTiO3 (10 nm/100 nm/0.5 mm) samples were grown using the pulsed-laser deposition (PLD) method and were ex situ transferred from the PLD chamber to ultrahigh vacuum (UHV) chambers for annealing, LEED, and ARPES studies. UHV annealing starting from 300 degrees C up to 550 degrees C, followed by LEED and ARPES measurements, show 1 x 1 surfaces with nondispersive energy-momentum bands. The 1 x 1 surface reconstructs into a root 2. x root 2R45 degrees one at an annealing temperature of 700 degrees C where the ARPES data show clear dispersive bands with a valence band maximum located around 3.3 eV below the Fermi level. While the root 2 x root 2R45 degrees surface reconstruction is stable under further UHV annealing, it is reversed to a 1 x 1 surface by annealing the sample in 400 mTorr oxygen at 600 degrees C. Another UHV annealing at 600 degrees C, followed by LEED and ARPES measurements, suggests that LEED root 2 x root 2R45 degrees surface reconstruction and ARPES dispersive bands are reproduced. Our results provide a better picture of the electronic structure of BaSnO3 surfaces and are suggestive of the role of oxygen vacancies in reversible root 2 x root 2R45 degrees surface reconstruction
URI
https://pr.ibs.re.kr/handle/8788114/7855
DOI
10.1103/PhysRevMaterials.4.055003
ISSN
2475-9953
Appears in Collections:
Center for Correlated Electron Systems(강상관계 물질 연구단) > 1. Journal Papers (저널논문)
Files in This Item:
There are no files associated with this item.

qrcode

  • facebook

    twitter

  • Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
해당 아이템을 이메일로 공유하기 원하시면 인증을 거치시기 바랍니다.

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Browse