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강상관계물질연구단
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root 2 x root 2R45 degrees surface reconstruction and electronic structure of BaSnO3 film

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dc.contributor.authorShoresh Soltani-
dc.contributor.authorSungyun Hong-
dc.contributor.authorBongju Kim-
dc.contributor.authorDonghan Kim-
dc.contributor.authorJong Keun Jung-
dc.contributor.authorByungmin Sohn-
dc.contributor.authorTae Won Noh-
dc.contributor.authorKookrin Char-
dc.contributor.authorChangyoung Kim-
dc.date.accessioned2020-12-22T03:02:35Z-
dc.date.accessioned2020-12-22T03:02:35Z-
dc.date.available2020-12-22T03:02:35Z-
dc.date.available2020-12-22T03:02:35Z-
dc.date.created2020-06-29-
dc.date.issued2020-05-
dc.identifier.issn2475-9953-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/7855-
dc.description.abstract©2020 American Physical Society. We studied the surface and electronic structures of barium stannate (BaSnO3) thin films by low-energy electron diffraction (LEED) and angle-resolved photoemission spectroscopy (ARPES) techniques. BaSnO3/Ba0.96La0.04SnO3/SrTiO3 (10 nm/100 nm/0.5 mm) samples were grown using the pulsed-laser deposition (PLD) method and were ex situ transferred from the PLD chamber to ultrahigh vacuum (UHV) chambers for annealing, LEED, and ARPES studies. UHV annealing starting from 300 degrees C up to 550 degrees C, followed by LEED and ARPES measurements, show 1 x 1 surfaces with nondispersive energy-momentum bands. The 1 x 1 surface reconstructs into a root 2. x root 2R45 degrees one at an annealing temperature of 700 degrees C where the ARPES data show clear dispersive bands with a valence band maximum located around 3.3 eV below the Fermi level. While the root 2 x root 2R45 degrees surface reconstruction is stable under further UHV annealing, it is reversed to a 1 x 1 surface by annealing the sample in 400 mTorr oxygen at 600 degrees C. Another UHV annealing at 600 degrees C, followed by LEED and ARPES measurements, suggests that LEED root 2 x root 2R45 degrees surface reconstruction and ARPES dispersive bands are reproduced. Our results provide a better picture of the electronic structure of BaSnO3 surfaces and are suggestive of the role of oxygen vacancies in reversible root 2 x root 2R45 degrees surface reconstruction-
dc.description.uri1-
dc.language영어-
dc.publisherAMER PHYSICAL SOC-
dc.subjectBAND-GAP-
dc.subjectTRANSPARENT-
dc.subjectMOBILITY-
dc.titleroot 2 x root 2R45 degrees surface reconstruction and electronic structure of BaSnO3 film-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000533201000005-
dc.identifier.scopusid2-s2.0-85087855734-
dc.identifier.rimsid72529-
dc.contributor.affiliatedAuthorBongju Kim-
dc.contributor.affiliatedAuthorDonghan Kim-
dc.contributor.affiliatedAuthorJong Keun Jung-
dc.contributor.affiliatedAuthorByungmin Sohn-
dc.contributor.affiliatedAuthorTae Won Noh-
dc.contributor.affiliatedAuthorChangyoung Kim-
dc.identifier.doi10.1103/PhysRevMaterials.4.055003-
dc.identifier.bibliographicCitationPHYSICAL REVIEW MATERIALS, v.4, no.5, pp.055003-
dc.citation.titlePHYSICAL REVIEW MATERIALS-
dc.citation.volume4-
dc.citation.number5-
dc.citation.startPage055003-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusBAND-GAP-
dc.subject.keywordPlusTRANSPARENT-
dc.subject.keywordPlusMOBILITY-
Appears in Collections:
Center for Correlated Electron Systems(강상관계 물질 연구단) > 1. Journal Papers (저널논문)
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