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다차원 탄소재료 연구단
다차원 탄소재료 연구단
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Complete determination of the crystallographic orientation of ReX2 (X = S, Se) by polarized Raman spectroscopy

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Title
Complete determination of the crystallographic orientation of ReX2 (X = S, Se) by polarized Raman spectroscopy
Author(s)
Choi, Y; Kim, K; Lim, SY; Kim, J; Park, JM; Jung Hwa Kim; Zonghoon Lee; Cheong, H
Publication Date
2020-02
Journal
NANOSCALE HORIZONS, v.5, no.2, pp.308 - 315
Publisher
ROYAL SOC CHEMISTRY
Abstract
Polarized Raman spectroscopy on few-layer ReS2 and ReSe2 was carried out to determine the crystallographic orientations. Since monolayer ReX2 (X = S or Se) has a distorted trigonal structure with only an inversion center, there is in-plane anisotropy and the two faces of a monolayer crystal are not equivalent. Since many physical properties vary sensitively depending on the crystallographic orientation, it is important to develop a reliable method to determine the crystal axes of ReX2. By comparing the relative polarization dependences of some representative Raman modes measured with three different excitation laser energies with high-resolution scanning transmission electron microscopy, we established a reliable procedure to determine all three principal directions of few-layer ReX2, including a way to distinguish the two types of faces: a 2.41 eV laser for ReS2 or a 1.96 eV laser for ReSe2 should be chosen as the excitation source of polarized Raman measurements; then the relative directions of the maximum intensity polarization of the Raman modes at 151 and 212 cm(-1) (124 and 161 cm(-1)) of ReS2 (ReSe2) can be used to determine the face types and the Re-chain direction unambiguously. ©The Royal Society of Chemistry 2020
URI
https://pr.ibs.re.kr/handle/8788114/7176
ISSN
2055-6756
Appears in Collections:
Center for Multidimensional Carbon Materials(다차원 탄소재료 연구단) > Journal Papers (저널논문)
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