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Minimizing Trap Charge Density towards an Ideal Diode in Graphene-Silicon Schottky Solar Cell

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Title
Minimizing Trap Charge Density towards an Ideal Diode in Graphene-Silicon Schottky Solar Cell
Author(s)
Subash Adhikari; Chandan Biswas; Manh-Ha Doan; Sungtae Kim; Chandramouli Kulshreshtha; Young Hee Lee
Subject
graphene, ; ionic liquid doping, ; Schottky solar cell, ; space-charge current, ; TFSA doping
Publication Date
2019-01
Journal
ACS APPLIED MATERIALS & INTERFACES, v.11, no.1, pp.880 - 888
Publisher
AMER CHEMICAL SOC
Abstract
Photovoltaic device performance of graphene/n-Si Schottky diodes is largely affected by inhomogeneous oxide formation at the interface that suppresses the tunneling current of injected and photoexcited charges. The accumulated trap charges at low current induce charge recombination at the interface and degrade the ideality factor of the diode and the fill factor (FF) of the solar cell. This consequently gives rise to a nonlinear current-voltage (I-V) feature in solar cells, commonly known as an S-shaped kink, which can be engineered by optimizing the interface barrier thickness or by increasing the carrier mobility. Here, we present chemical and electrochemical doping methods to increase the conductivity of graphene that transforms nonlinear kink photodiodes with a low FF and solar cell efficiency towards trap-free linear photovoltaic I-V. Space-charge-limited-current manifested Ohmic I-V diode behavior with enhanced conductance in graphene by injecting homogeneous ionic liquid; confirming the significant reduction of trap charge density. This was further congruent with the disappearance of the nonlinear kink in photodiodes with a high FF and nearly ideal diodes. The solar cell efficiency obtained with our strategy is around 13.6% and suggests possibilities to reach the theoretical limit of 19% by tailoring parameters such as conductance of graphene, carrier density of Si, and oxidation of the interfaces. © 2018 American Chemical Society.
URI
https://pr.ibs.re.kr/handle/8788114/5730
DOI
10.1021/acsami.8b18140
ISSN
1944-8244
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > 1. Journal Papers (저널논문)
Files in This Item:
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