Edge Delamination of Monolayer Transition Metal Dichalcogenides

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Title
Edge Delamination of Monolayer Transition Metal Dichalcogenides
Author(s)
Thuc Hue Ly; Seok Joon Yun; Quoc Huy Thi; Jiong Zhao
Publication Date
2017-07
Journal
ACS NANO, v.11, no.7, pp.7534 - 7541
Publisher
AMER CHEMICAL SOC
Abstract
Delamination of thin films from the supportive substrates is a critical issue within the thin film industry. The emergent two-dimensional, atomic layered materials, including transition metal dichalcogenides, are highly flexible; thus buckles and wrinkles can be easily generated and play vital roles in the corresponding physical properties. Here we introduce one kind of patterned buckling behavior caused by the delamination from a substrate initiated at the edges of the chemical vapor deposition synthesized monolayer transition metal dichalcogenides, led by thermal expansion mismatch. The atomic force microscopy and optical characterizations clearly showed the puckered structures associated with the strain, whereas the transmission electron microscopy revealed the special sawtooth-shaped edges, which break the geometrical symmetry for the buckling behavior of hexagonal samples. The condition of the edge delamination is in accordance with the fracture behavior of thin film interfaces. This edge delamination and buckling process is universal for most ultrathin two-dimensional materials, which requires more attention in various future applications. © 2017 American Chemical Society
URI
https://pr.ibs.re.kr/handle/8788114/3823
ISSN
1936-0851
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > Journal Papers (저널논문)
Files in This Item:
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