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첨단연성물질 연구단
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Ultrafast electron microscopy integrated with a direct electron detection camera

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Title
Ultrafast electron microscopy integrated with a direct electron detection camera
Author(s)
Young Min Lee; Young Jae Kim; Ye-Jin Kim; Oh-Hoon Kwon
Publication Date
2017-07
Journal
STRUCTURAL DYNAMICS, v.4, no.4, pp.044023 -
Publisher
AMER INST PHYSICS
Abstract
In the past decade, we have witnessed the rapid growth of the field of ultrafast electron microscopy (UEM), which provides intuitive means to watch atomic and molecular motions of matter. Yet, because of the limited current of the pulsed electron beam resulting from space-charge effects, observations have been mainly made to periodic motions of the crystalline structure of hundreds of nanometers or higher by stroboscopic imaging at high repetition rates. Here, we develop an advanced UEM with robust capabilities for circumventing the present limitations by integrating a direct electron detection camera for the first time which allows for imaging at low repetition rates. This approach is expected to promote UEM to a more powerful platform to visualize molecular and collective motions and dissect fundamental physical, chemical, and materials phenomena in space and time. (C) 2017 Author(s)
URI
http://pr.ibs.re.kr/handle/8788114/3659
DOI
10.1063/1.4983226
ISSN
2329-7778
Appears in Collections:
Center for Soft and Living Matter(첨단연성물질 연구단) > Journal Papers (저널논문)
Files in This Item:
2017_Struct. Dyn._Ultrafast electron microscopy integrated with a direct electron detection camera_Oh-hoon.pdfDownload

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