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나노 구조 물리 연구단
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Epsilon-Near-Zero meta-lens for high resolution wide-field imaging

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Title
Epsilon-Near-Zero meta-lens for high resolution wide-field imaging
Author(s)
Kyoung, J; Doo Jae Park; Byun, SJ; Lee, J; Choi, SB; Park, S; Hwang, SW
Publication Date
2014-12
Journal
OPTICS EXPRESS, v.22, no.26, pp.31875 - 31883
Publisher
OPTICAL SOC AMER
Abstract
Herein, we will propose a new application possibility of epsilonnear- zero (ENZ) materials: high resolution wide-field imaging. We show that the resolution can be dramatically enhanced by simply inserting a thin epsilon-near-zero (ENZ) material between the sample and substrate. By performing metal half-plane imaging, we experimentally demonstrate that the resolution could be enhanced by about 47% with a 300-nm-thick SiO2 interlayer, an ENZ material at 8-μm-wavelength (1250 cm−1). The physical origin of the resolution enhancement is the strong conversion of diffracted near fields to quasi-zeroth order far fields enabled by the directive emission of ENZ materials.
URI
https://pr.ibs.re.kr/handle/8788114/1810
ISSN
1094-4087
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > Journal Papers (저널논문)
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