Low voltage transmission electron microscopy of Graphene

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Title
Low voltage transmission electron microscopy of Graphene
Author(s)
Alicja Bachmatiuk; Jiong Zhao; Gorantla S.M.; Martinez I.G.G.; Wiedermann J.; Lee C.; Eckert J.; Mark Hermann Rummeli
Publication Date
2015-02
Journal
SMALL, v.11, no.5, pp.515 - 542
Publisher
WILEY-V C H VERLAG GMBH
Abstract
The initial isolation of graphene in 2004 spawned massive interest in this two-dimensional pure sp 2 carbon structure due to its incredible electrical, optical, mechanical, and thermal effects. This in turn led to the rapid development of various characterization tools for graphene. Examples include Raman spectroscopy and scanning tunneling microscopy. However, the one tool with the greatest prowess for characterizing and studying graphene is the transmission electron microscope. State-of-the-art (scanning) transmission electron microscopes enable one to image graphene with atomic resolution, and also to conduct various other characterizations simultaneously. The advent of aberration correctors was timely in that it allowed transmission electron microscopes to operate with reduced acceleration voltages, so that damage to graphene is avoided while still providing atomic resolution. In this comprehensive review, a brief introduction is provided to the technical aspects of transmission electron microscopes relevant to graphene. The reader is then introduced to different specimen preparation techniques for graphene. The different characterization approaches in both transmission electron microscopy and scanning transmission electron microscopy are then discussed, along with the different aspects of electron diffraction and electron energy loss spectroscopy. The use of graphene for other electron microscopy approaches such as in-situ investigations is also presented.
URI
https://pr.ibs.re.kr/handle/8788114/1791
ISSN
1613-6810
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > Journal Papers (저널논문)
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