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Strain effects on in-plane conductance of the topological insulator Bi2Te3

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Title: Strain effects on in-plane conductance of the topological insulator Bi2Te3

Author(s): Jin Heui Hwang; Sangku Kwon; Park J.; Jong Hun Kim; Lee J.; Kim J.S.; Lyeo H.-K.; Jeong Young Park

Subject: Atomic force microscopy, ; Electric insulators, ; Stresses, ; Combined effect, ; Conductive probe atomic force microscopies, ; Current mapping, ; Electrical transport, ; Mechanical stress, ; Spin-orbit couplings, ; Topological insulators, ; Vacuum environment, ; Current density

Abstract: We investigated the correlation between electrical transport and mechanical stress in a topological insulator, Bi2Te3, using conductive probe atomic force microscopy in an ultrahigh vacuum environment. After directly measuring charge transport on the cleaved Bi2Te 3 surface, we found that the current density varied with applied load. Current mapping revealed a variation of the current on different terraces. The current density increased in the low-pressure regime and then decreased in the high-pressure regime. This variation of current density was explained in light of the combined effect of changes in the in-plane conductance due to spin-orbit coupling and hexagonal warping. © 2014 AIP Publishing LLC.