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나노물질및화학반응연구단
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Strain effects on in-plane conductance of the topological insulator Bi2Te3

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dc.contributor.authorJin Heui Hwang-
dc.contributor.authorSangku Kwon-
dc.contributor.authorPark J.-
dc.contributor.authorJong Hun Kim-
dc.contributor.authorLee J.-
dc.contributor.authorKim J.S.-
dc.contributor.authorLyeo H.-K.-
dc.contributor.authorJeong Young Park-
dc.date.available2015-04-20T06:05:25Z-
dc.date.created2014-09-11ko
dc.date.issued2014-04-
dc.identifier.issn0003-6951-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/1080-
dc.description.abstractWe investigated the correlation between electrical transport and mechanical stress in a topological insulator, Bi2Te3, using conductive probe atomic force microscopy in an ultrahigh vacuum environment. After directly measuring charge transport on the cleaved Bi2Te 3 surface, we found that the current density varied with applied load. Current mapping revealed a variation of the current on different terraces. The current density increased in the low-pressure regime and then decreased in the high-pressure regime. This variation of current density was explained in light of the combined effect of changes in the in-plane conductance due to spin-orbit coupling and hexagonal warping. © 2014 AIP Publishing LLC.-
dc.description.uri1-
dc.language영어-
dc.publisherAMER INST PHYSICS-
dc.subjectAtomic force microscopy-
dc.subjectElectric insulators-
dc.subjectStresses-
dc.subjectCombined effect-
dc.subjectConductive probe atomic force microscopies-
dc.subjectCurrent mapping-
dc.subjectElectrical transport-
dc.subjectMechanical stress-
dc.subjectSpin-orbit couplings-
dc.subjectTopological insulators-
dc.subjectVacuum environment-
dc.subjectCurrent density-
dc.titleStrain effects on in-plane conductance of the topological insulator Bi2Te3-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000335145600030-
dc.identifier.scopusid2-s2.0-84900332283-
dc.identifier.rimsid53654ko
dc.date.tcdate2018-10-01-
dc.contributor.affiliatedAuthorJin Heui Hwang-
dc.contributor.affiliatedAuthorSangku Kwon-
dc.contributor.affiliatedAuthorJong Hun Kim-
dc.contributor.affiliatedAuthorJeong Young Park-
dc.identifier.doi10.1063/1.4873389-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.104, no.16, pp.161613-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume104-
dc.citation.number16-
dc.citation.startPage161613-
dc.date.scptcdate2018-10-01-
dc.description.wostc8-
dc.description.scptc9-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
Appears in Collections:
Center for Nanomaterials and Chemical Reactions(나노물질 및 화학반응 연구단) > 1. Journal Papers (저널논문)
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