Controlled electropolishing of copper foils at elevated temperature
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kwon, Gi Duk | - |
dc.contributor.author | Kim, Young Woo | - |
dc.contributor.author | Moyen, Eric | - |
dc.contributor.author | Keum, Dong Hoon | - |
dc.contributor.author | Young Hee Lee | - |
dc.contributor.author | Seunghyun Baik | - |
dc.contributor.author | Pribat, Didier | - |
dc.date.available | 2015-04-20T05:42:46Z | - |
dc.date.created | 2014-08-11 | - |
dc.date.issued | 2014-07 | - |
dc.identifier.issn | 0169-4332 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/974 | - |
dc.description.abstract | We have studied the electrochemical polishing of copper foils at elevated temperature, in H3PO4 electrolytes of various concentrations. Atomic force microscopy, surface reflectance measurements as well as optical microscopy and scanning electron microscopy (including electron backscattering diffraction) have been used throughout this study to characterize the surface of the electropolished foils. We have found that copper foils electropolished at 65 °C in 2.17 M H3PO4, exhibited a lower surface roughness and a higher percent specular reflection, comparing with values obtained after classical electropolishing in concentrated H 3PO4 at room temperature or comparing with values obtained after chemical-mechanical polishing. This work could open up new prospects for the preparation of copper foils before the growth of high quality graphene layers. © 2014 Elsevier B.V. All rights reserved. | - |
dc.language | 영어 | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.subject | Electropolishing | - |
dc.subject | Elevated temperature | - |
dc.subject | Rolled copper foils | - |
dc.subject | rms roughness | - |
dc.subject | Surface reflectance | - |
dc.title | Controlled electropolishing of copper foils at elevated temperature | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000336596700101 | - |
dc.identifier.scopusid | 2-s2.0-84901327655 | - |
dc.identifier.rimsid | 449 | ko |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Young Hee Lee | - |
dc.contributor.affiliatedAuthor | Seunghyun Baik | - |
dc.identifier.doi | 10.1016/j.apsusc.2014.04.144 | - |
dc.identifier.bibliographicCitation | APPLIED SURFACE SCIENCE, v.307, pp.731 - 735 | - |
dc.relation.isPartOf | APPLIED SURFACE SCIENCE | - |
dc.citation.title | APPLIED SURFACE SCIENCE | - |
dc.citation.volume | 307 | - |
dc.citation.startPage | 731 | - |
dc.citation.endPage | 735 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 12 | - |
dc.description.scptc | 12 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | CHEMICAL-VAPOR-DEPOSITION | - |
dc.subject.keywordPlus | PHOSPHORIC-ACID | - |
dc.subject.keywordPlus | FUNDAMENTAL-ASPECTS | - |
dc.subject.keywordPlus | GRAPHENE GROWTH | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | IN-SITU | - |
dc.subject.keywordPlus | SURFACE | - |
dc.subject.keywordPlus | PLANARIZATION | - |
dc.subject.keywordPlus | MORPHOLOGY | - |
dc.subject.keywordPlus | ULSI | - |
dc.subject.keywordAuthor | Electropolishing | - |
dc.subject.keywordAuthor | Elevated temperature | - |
dc.subject.keywordAuthor | Rolled copper foils | - |
dc.subject.keywordAuthor | rms roughness | - |
dc.subject.keywordAuthor | Surface reflectance | - |