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Controlled electropolishing of copper foils at elevated temperature

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dc.contributor.authorKwon, Gi Duk-
dc.contributor.authorKim, Young Woo-
dc.contributor.authorMoyen, Eric-
dc.contributor.authorKeum, Dong Hoon-
dc.contributor.authorYoung Hee Lee-
dc.contributor.authorSeunghyun Baik-
dc.contributor.authorPribat, Didier-
dc.date.available2015-04-20T05:42:46Z-
dc.date.created2014-08-11-
dc.date.issued2014-07-
dc.identifier.issn0169-4332-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/974-
dc.description.abstractWe have studied the electrochemical polishing of copper foils at elevated temperature, in H3PO4 electrolytes of various concentrations. Atomic force microscopy, surface reflectance measurements as well as optical microscopy and scanning electron microscopy (including electron backscattering diffraction) have been used throughout this study to characterize the surface of the electropolished foils. We have found that copper foils electropolished at 65 °C in 2.17 M H3PO4, exhibited a lower surface roughness and a higher percent specular reflection, comparing with values obtained after classical electropolishing in concentrated H 3PO4 at room temperature or comparing with values obtained after chemical-mechanical polishing. This work could open up new prospects for the preparation of copper foils before the growth of high quality graphene layers. © 2014 Elsevier B.V. All rights reserved.-
dc.language영어-
dc.publisherELSEVIER SCIENCE BV-
dc.subjectElectropolishing-
dc.subjectElevated temperature-
dc.subjectRolled copper foils-
dc.subjectrms roughness-
dc.subjectSurface reflectance-
dc.titleControlled electropolishing of copper foils at elevated temperature-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000336596700101-
dc.identifier.scopusid2-s2.0-84901327655-
dc.identifier.rimsid449ko
dc.date.tcdate2018-10-01-
dc.contributor.affiliatedAuthorYoung Hee Lee-
dc.contributor.affiliatedAuthorSeunghyun Baik-
dc.identifier.doi10.1016/j.apsusc.2014.04.144-
dc.identifier.bibliographicCitationAPPLIED SURFACE SCIENCE, v.307, pp.731 - 735-
dc.relation.isPartOfAPPLIED SURFACE SCIENCE-
dc.citation.titleAPPLIED SURFACE SCIENCE-
dc.citation.volume307-
dc.citation.startPage731-
dc.citation.endPage735-
dc.date.scptcdate2018-10-01-
dc.description.wostc12-
dc.description.scptc12-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusCHEMICAL-VAPOR-DEPOSITION-
dc.subject.keywordPlusPHOSPHORIC-ACID-
dc.subject.keywordPlusFUNDAMENTAL-ASPECTS-
dc.subject.keywordPlusGRAPHENE GROWTH-
dc.subject.keywordPlusTHIN-FILMS-
dc.subject.keywordPlusIN-SITU-
dc.subject.keywordPlusSURFACE-
dc.subject.keywordPlusPLANARIZATION-
dc.subject.keywordPlusMORPHOLOGY-
dc.subject.keywordPlusULSI-
dc.subject.keywordAuthorElectropolishing-
dc.subject.keywordAuthorElevated temperature-
dc.subject.keywordAuthorRolled copper foils-
dc.subject.keywordAuthorrms roughness-
dc.subject.keywordAuthorSurface reflectance-
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > 1. Journal Papers (저널논문)
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