Effect of Deposition Temperature on the Formation of Defect Phases in BiFeO3 Thin Films

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Title
Effect of Deposition Temperature on the Formation of Defect Phases in BiFeO3 Thin Films
Author(s)
Byung Chul Jeon; Seung Chul Chae; Tae Dong Kang; Soon Jae Moon
Publication Date
2014-06
Journal
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.64, no.12, pp.1849 - 1853
Publisher
KOREAN PHYSICAL SOC
Abstract
We report the effects of deposition temperature on the evolution of defect and second phases and on the ferroelectric properties of BiFeO3 thin films. We grew BiFeO3 thin films on (001) SrTiO3 substrates by using pulsed laser deposition at temperatures in the range of 570 − 600 ◦ C at intervals of 10 ◦ C. We found that defects and a resulting second phase appeared at temperatures greater than 590 ◦ C. The second phase led to significant changes in the optical absorption and to the appearance of impurity peaks in the X-ray diffraction data. An analysis of the X-ray diffraction data indicated that the second phase was Fe2O3. Atomic force microscopy measurements showed that the appearance of defects accompanied an abrupt increase in the surface roughness. Furthermore, the presence of the second phase significantly affected the ferroelectric hysteresis. Our results suggest that the evolution of defects and resulting second phase in BiFeO3 thin films depends strongly on the deposition temperature.
URI
https://pr.ibs.re.kr/handle/8788114/787
ISSN
0374-4884
Appears in Collections:
Center for Correlated Electron Systems(강상관계 물질 연구단) > Journal Papers (저널논문)
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