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Synthesis of hexagonal boron nitride heterostructures for 2D van der Waals electronics

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dc.contributor.authorKi Kang Kim-
dc.contributor.authorHyun Seok Lee-
dc.contributor.authorYoung Hee Lee-
dc.date.available2019-01-03T05:33:32Z-
dc.date.created2018-10-15-
dc.date.issued2018-08-
dc.identifier.issn0306-0012-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/5238-
dc.description.abstractAmong two dimensional (2D) van der Waals (vdW) layered materials such as graphene, which is used like a metal, and transition metal chalcogenides (TMdCs), which are used as semiconductors and metals, hexagonal boron nitride (hBN), which is used as an insulator, is ubiquitous as a building block to construct 2D vdW electronics for versatile tunneling devices. Monolayer and few-layer hBN films have been prepared with flake sizes of a few hundred micrometer via mechanical exfoliation and transfer methods. Another approach used to synthesize hBN films on a large scale is chemical vapor deposition (CVD). Although the single-crystal film growth of hBN on the wafer scale is the key to realizing realistic electronic applications, the various functionalities of hBN for 2D electronics are mostly limited to the microscale. Here, we review the recent progress for the large-area synthesis of hBN and other related vdW heterostructures via CVD, and the artificial construction of vdW heterostructures and 2D vdW electronics based on hBN, in terms of charge fluctuations, passivation, gate dielectrics, tunneling, Coulombic interactions, and contact resistances. The challenges and future perspectives for practical applications are also addressed.©The Royal Society of Chemistry 2018-
dc.description.uri1-
dc.language영어-
dc.publisherROYAL SOC CHEMISTRY-
dc.titleSynthesis of hexagonal boron nitride heterostructures for 2D van der Waals electronics-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000441712800008-
dc.identifier.scopusid2-s2.0-85051497659-
dc.identifier.rimsid65420-
dc.contributor.affiliatedAuthorYoung Hee Lee-
dc.identifier.doi10.1039/c8cs00450a-
dc.identifier.bibliographicCitationCHEMICAL SOCIETY REVIEWS, v.47, no.16, pp.6342 - 6369-
dc.citation.titleCHEMICAL SOCIETY REVIEWS-
dc.citation.volume47-
dc.citation.number16-
dc.citation.startPage6342-
dc.citation.endPage6369-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusCHEMICAL-VAPOR-DEPOSITION-
dc.subject.keywordPlusTRANSITION-METAL DICHALCOGENIDES-
dc.subject.keywordPlusFIELD-EFFECT TRANSISTORS-
dc.subject.keywordPlusTHIN MOS2/WS2 HETEROSTRUCTURES-
dc.subject.keywordPlusINSULATOR-SEMICONDUCTOR DIODE-
dc.subject.keywordPlusSCANNING-TUNNELING-MICROSCOPY-
dc.subject.keywordPlusEXFOLIATED BLACK PHOSPHORUS-
dc.subject.keywordPlusLIGHT-EMITTING-DIODES-
dc.subject.keywordPlusP-N-JUNCTIONS-
dc.subject.keywordPlusMONOLAYER MOS2-
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > 1. Journal Papers (저널논문)
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