Improved design for a low temperature scanning tunneling microscope with an in situ tip treatment stage

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Title
Improved design for a low temperature scanning tunneling microscope with an in situ tip treatment stage
Author(s)
Jongjeong Kim; Sang Hyun Joo; K. S. Lee; Junghoon Yoo; M. S. Park; Jinseok Kwak; Jinho Lee
Publication Date
2017-04
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS, v.88, no.4, pp.043702 -
Publisher
AMER INST PHYSICS
Abstract
The Low Temperature Scanning Tunneling Microscope (LT-STM) is an extremely valuable tool not only in surface science but also in condensed matter physics. For years, numerous new ideas have been adopted to perfect LT-STM performances-Ultra-Low Vibration (ULV) laboratory and the rigid STM head design are among them. Here, we present three improvements for the design of the ULV laboratory and the LT-STM: tip treatment stage, sample cleaving stage, and vibration isolation system. The improved tip treatment stage enables us to perform field emission for the purpose of tip treatment in situ without exchanging samples, while our enhanced sample cleaving stage allows us to cleave samples at low temperature in a vacuum without optical access by a simple pressing motion. Our newly designed vibration isolation system provides efficient space usage while maintaining vibration isolation capability. These improvements enhance the quality of spectroscopic imaging experiments that can last for many days and provide increased data yield, which we expect can be indispensable elements in future LT-STM designs. Published by AIP Publishing
URI
https://pr.ibs.re.kr/handle/8788114/4807
ISSN
0034-6748
Appears in Collections:
Center for Correlated Electron Systems(강상관계 물질 연구단) > Journal Papers (저널논문)
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