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Frank–van der Merwe Growth versus Volmer–Weber Growth in Successive Stacking of a Few-Layer Bi2Te3/Sb2Te3 by van der Waals Heteroepitaxy: The Critical Roles of Finite Lattice-Mismatch with Seed Substrates

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Title
Frank–van der Merwe Growth versus Volmer–Weber Growth in Successive Stacking of a Few-Layer Bi2Te3/Sb2Te3 by van der Waals Heteroepitaxy: The Critical Roles of Finite Lattice-Mismatch with Seed Substrates
Author(s)
Hoseok Heo; Ji Ho Sung; Ji-Hoon Ahn; Fereshte Ghahari; Takashi Taniguchi; Kenji Watanabe; Philip Kim; Moon-Ho Jo
Subject
2D materials, ; metal chalcogenide, ; superlattice, ; thin film growth modes, ; van der Waals epitaxy
Publication Date
2017-02
Journal
ADVANCED ELECTRONIC MATERIALS, v.3, no.2, pp.1600375
Publisher
WILEY
Abstract
Different growth mechanisms of van der Waals heteroepitaxial 2D Bi2Te3/Sb2Te3 stacking by choosing different substrates are reported. Sequential Bi2Te3/Sb2Te3 stacking growth mode becomes layer-by-layer growth on h-BN substrates, and 3D island growth on SiO2/Si. Compressive strain in the h-BN substrates imposed by the lattice mismatch plays a crucial role to determine different growth modes in these 2D nucleation kinetics models. © 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
URI
https://pr.ibs.re.kr/handle/8788114/3764
DOI
10.1002/aelm.201600375
ISSN
2199-160X
Appears in Collections:
Center for Artificial Low Dimensional Electronic Systems(원자제어 저차원 전자계 연구단) > 1. Journal Papers (저널논문)
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