Interface Control of Ferroelectricity in an SrRuO3/BaTiO3/SrRuO3 Capacitor and its Critical Thickness

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Title
Interface Control of Ferroelectricity in an SrRuO3/BaTiO3/SrRuO3 Capacitor and its Critical Thickness
Author(s)
Yeong Jae Shin; Yoonkoo Kim; Sung Jin Kang; Ho-Hyun Nahm; Pattukkannu Murugavel; Jeong Rae Kim; Myung Rae Cho; Lingfei Wang; Sang Mo Yang; Jong-Gul Yoon; Jin-Seok Chung; Miyoung Kim; Hua Zhou; Seo Hyoung Chang; Tae Won Noh
Publication Date
2017-05
Journal
ADVANCED MATERIALS, v.29, no.19, pp.1602795 -
Publisher
WILEY-V C H VERLAG GMBH
Abstract
The atomic-scale synthesis of artificial oxide heterostructures offers new opportunities to create novel states that do not occur in nature. The main challenge related to synthesizing these structures is obtaining atomically sharp interfaces with designed termination sequences. In this study, it is demonstrated that the oxygen pressure (PO2 ) during growth plays an important role in controlling the interfacial terminations of SrRuO3/BaTiO3/SrRuO3 (SRO/BTO/SRO) ferroelectric (FE) capacitors. The SRO/BTO/SRO heterostructures are grown by a pulsed laser deposition method. The top SRO/BTO interface, grown at high PO2 (around 150 mTorr), usually exhibits a mixture of RuO2–BaO and SrO–TiO2 terminations. By reducing PO2, the authors obtain atomically sharp SRO/BTO top interfaces with uniform SrO–TiO2 termination. Using capacitor devices with symmetric and uniform interfacial termination, it is demonstrated for the first time that the FE critical thickness can reach the theoretical limit of 3.5 unit cells. © 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
URI
https://pr.ibs.re.kr/handle/8788114/3537
ISSN
0935-9648
Appears in Collections:
Center for Correlated Electron Systems(강상관계 물질 연구단) > Journal Papers (저널논문)
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