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Phase conversion of chemically exfoliated molybdenum disulfide

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dc.contributor.authorJaesu Kim-
dc.contributor.authorJun Suk Kim-
dc.contributor.authorTae Soo Kim-
dc.contributor.authorHomin Choi-
dc.contributor.authorJin Hee Lee-
dc.contributor.authorHyun Jin Ji-
dc.contributor.authorSeong Chu Lim-
dc.date.available2017-01-20T08:30:04Z-
dc.date.created2016-11-23-
dc.date.issued2017-01-
dc.identifier.issn1567-1739-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/3201-
dc.description.abstractMultilayer MoS2 is exfoliated by Li treatment. A thin film of Li-treated MoS2 contains a large portion of 1T phases. This is attributed to the atomic structural change caused by Li insertion, which is investigated using X-ray photoelectron spectroscopy (XPS). In a phase recovery via thermal annealing at 523 K in air, we observe another phase, referred to as the relaxed 1T phase, with a slightly larger binding energy than the 1T phase. After annealing at 523 K in air, the peak intensity of the relaxed 1T phase is reduced, accompanying a strong MoOx peak and weak S 2s peak, according to XPS. This indicates that the annealing of Li-treated MoS2 in air yields sulfur vacancies that induce the oxidation of Mo. However, after annealing at 523 K in vacuum, no MoOx is observed, and the considerable peak intensity of the relaxed 1T phase remains, which starkly contrasts Raman-spectroscopy results supporting a full recovery from the 1T phase to the 2H phase. The absence of a gating effect of the Li-treated MoS2 device supports the possibility of an incomplete phase change of Li-treated MoS2 annealed in a vacuum. © 2016 Elsevier B.V. All rights reserved.-
dc.description.uri1-
dc.language영어-
dc.publisherELSEVIER SCIENCE BV-
dc.subjectChemical exfoliation-
dc.subjectLi intercalation-
dc.subjectMoS2-
dc.subjectPhase transition-
dc.titlePhase conversion of chemically exfoliated molybdenum disulfide-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000390428900011-
dc.identifier.scopusid2-s2.0-84994764938-
dc.identifier.rimsid57705ko
dc.date.tcdate2018-10-01-
dc.contributor.affiliatedAuthorJaesu Kim-
dc.contributor.affiliatedAuthorJun Suk Kim-
dc.contributor.affiliatedAuthorTae Soo Kim-
dc.contributor.affiliatedAuthorHomin Choi-
dc.contributor.affiliatedAuthorJin Hee Lee-
dc.contributor.affiliatedAuthorSeong Chu Lim-
dc.identifier.doi10.1016/j.cap.2016.11.001-
dc.identifier.bibliographicCitationCURRENT APPLIED PHYSICS, v.17, no.1, pp.60 - 65-
dc.citation.titleCURRENT APPLIED PHYSICS-
dc.citation.volume17-
dc.citation.number1-
dc.citation.startPage60-
dc.citation.endPage65-
dc.date.scptcdate2018-10-01-
dc.description.wostc4-
dc.description.scptc5-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.subject.keywordPlusELECTRICAL-TRANSPORT PROPERTIES-
dc.subject.keywordPlusSINGLE-LAYER MOS2-
dc.subject.keywordPlusTRANSISTORS-
dc.subject.keywordPlusCONTACTS-
dc.subject.keywordPlusTRANSITION-
dc.subject.keywordPlusWSE2-
dc.subject.keywordPlusWS2-
dc.subject.keywordAuthorMoS2-
dc.subject.keywordAuthorPhase transition-
dc.subject.keywordAuthorLi intercalation-
dc.subject.keywordAuthorChemical exfoliation-
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > 1. Journal Papers (저널논문)
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