The energy band alignment at the interface between mechanically exfoliated few-layer NiPS3 nanosheets and ZnO
DC Field | Value | Language |
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dc.contributor.author | Cheng-Tai Kuo | - |
dc.contributor.author | Karuppannan Balamurugan | - |
dc.contributor.author | Shiu H.W. | - |
dc.contributor.author | Hyun Ju Park | - |
dc.contributor.author | Soobin Sinn | - |
dc.contributor.author | Michael Neumann | - |
dc.contributor.author | Han M. | - |
dc.contributor.author | Chang Y.J. | - |
dc.contributor.author | Chen C.-H. | - |
dc.contributor.author | Hyeong-Do Kim | - |
dc.contributor.author | Je-Geun Park | - |
dc.contributor.author | Tae Won Noh | - |
dc.date.available | 2016-07-19T07:40:16Z | - |
dc.date.created | 2016-02-19 | - |
dc.date.issued | 2016-03 | - |
dc.identifier.issn | 1567-1739 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/2684 | - |
dc.description.abstract | We have studied the electronic structure and interfacial properties of mechanically exfoliated few-layer NiPS3 van der Waals crystals on ZnO/Nb:SrTiO3 substrates using scanning photoelectron microscopy and spectroscopy. The conducting ZnO layer enhances the visibility of few-layer NiPS3 on Nb:SrTiO3 and prevents charging effects in photoemission. We experimentally determined a type-II band alignment at the NiPS3/ZnO interface. The valence band offset (VBO) of few-layer NiPS3/ZnO is 2.8 ± 0.09 eV, and the conduction band offset is 1.0 ± 0.09 eV. Moreover, we found an increase of ∼0.3 eV in VBO as decreasing NiPS3 thickness, suggesting electronic coupling or charge transfer at the NiPS3/ZnO interface. © 2016 Elsevier B.V. All rights reserved | - |
dc.description.uri | 1 | - |
dc.language | 영어 | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.subject | Band offset | - |
dc.subject | Exfoliation | - |
dc.subject | Nickel phosphorous trisulfide | - |
dc.subject | Photoemission spectroscopy | - |
dc.subject | Zinc oxide | - |
dc.title | The energy band alignment at the interface between mechanically exfoliated few-layer NiPS3 nanosheets and ZnO | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000369995000029 | - |
dc.identifier.scopusid | 2-s2.0-84954411768 | - |
dc.identifier.rimsid | 22375 | ko |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Cheng-Tai Kuo | - |
dc.contributor.affiliatedAuthor | Karuppannan Balamurugan | - |
dc.contributor.affiliatedAuthor | Hyun Ju Park | - |
dc.contributor.affiliatedAuthor | Soobin Sinn | - |
dc.contributor.affiliatedAuthor | Michael Neumann | - |
dc.contributor.affiliatedAuthor | Hyeong-Do Kim | - |
dc.contributor.affiliatedAuthor | Je-Geun Park | - |
dc.contributor.affiliatedAuthor | Tae Won Noh | - |
dc.identifier.doi | 10.1016/j.cap.2016.01.001 | - |
dc.identifier.bibliographicCitation | CURRENT APPLIED PHYSICS, v.16, no.3, pp.404 - 408 | - |
dc.citation.title | CURRENT APPLIED PHYSICS | - |
dc.citation.volume | 16 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 404 | - |
dc.citation.endPage | 408 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 5 | - |
dc.description.scptc | 4 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.subject.keywordAuthor | Band offset | - |
dc.subject.keywordAuthor | Exfoliation | - |
dc.subject.keywordAuthor | Nickel phosphorous trisulfide | - |
dc.subject.keywordAuthor | Photoemission spectroscopy | - |
dc.subject.keywordAuthor | Zinc oxide | - |