Misorientation-angle-dependent electrical transport across molybdenum disulfide grain boundaries
DC Field | Value | Language |
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dc.contributor.author | Thuc Hue Ly | - |
dc.contributor.author | David J. Perello | - |
dc.contributor.author | Jiong Zhao | - |
dc.contributor.author | Deng, QM | - |
dc.contributor.author | Hyun Kim | - |
dc.contributor.author | Gang Hee Han | - |
dc.contributor.author | Sang Hoon Chae | - |
dc.contributor.author | Hye Yun Jeong | - |
dc.contributor.author | Young Hee Lee | - |
dc.date.available | 2016-04-21T07:08:42Z | - |
dc.date.created | 2016-02-19 | ko |
dc.date.issued | 2016-01 | - |
dc.identifier.issn | 2041-1723 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/2462 | - |
dc.description.abstract | Grain boundaries in monolayer transition metal dichalcogenides have unique atomic defect structures and band dispersion relations that depend on the inter-domain misorientation angle. Here, we explore misorientation angle-dependent electrical transport at grain boundaries in monolayer MoS2 by correlating the atomic defect structures of measured devices analysed with transmission electron microscopy and first-principles calculations. Transmission electron microscopy indicates that grain boundaries are primarily composed of 5-7 dislocation cores with periodicity and additional complex defects formed at high angles, obeying the classical low-angle theory for angles <22 degrees. The inter-domain mobility is minimized for angles <9 degrees and increases nonlinearly by two orders of magnitude before saturating at similar to 16 cm(2) V-1 s(-1) around misorientation angle approximate to 20 degrees. This trend is explained via grain-boundary electrostatic barriers estimated from density functional calculations and experimental tunnelling barrier heights, which are approximate to 0.5 eV at low angles and approximate to 0.15 eV at high angles (>= 20 degrees) | - |
dc.description.uri | 1 | - |
dc.language | 영어 | - |
dc.publisher | NATURE PUBLISHING GROUP | - |
dc.title | Misorientation-angle-dependent electrical transport across molybdenum disulfide grain boundaries | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000369022600009 | - |
dc.identifier.scopusid | 2-s2.0-84955444098 | - |
dc.identifier.rimsid | 22344 | ko |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Thuc Hue Ly | - |
dc.contributor.affiliatedAuthor | David J. Perello | - |
dc.contributor.affiliatedAuthor | Jiong Zhao | - |
dc.contributor.affiliatedAuthor | Hyun Kim | - |
dc.contributor.affiliatedAuthor | Gang Hee Han | - |
dc.contributor.affiliatedAuthor | Sang Hoon Chae | - |
dc.contributor.affiliatedAuthor | Hye Yun Jeong | - |
dc.contributor.affiliatedAuthor | Young Hee Lee | - |
dc.identifier.doi | 10.1038/ncomms10426 | - |
dc.identifier.bibliographicCitation | NATURE COMMUNICATIONS, v.7, pp.10426 | - |
dc.citation.title | NATURE COMMUNICATIONS | - |
dc.citation.volume | 7 | - |
dc.citation.startPage | 10426 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 32 | - |
dc.description.scptc | 37 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | DISLOCATION SCATTERING | - |
dc.subject.keywordPlus | MOS2 | - |
dc.subject.keywordPlus | SEMICONDUCTORS | - |
dc.subject.keywordPlus | MOLECULES | - |
dc.subject.keywordPlus | DEFECTS | - |
dc.subject.keywordPlus | BANDGAP | - |
dc.subject.keywordPlus | SCALE | - |
dc.subject.keywordPlus | GAS | - |