BROWSE

Related Scientist

cinap's photo.

cinap
나노구조물리연구단
more info

ITEM VIEW & DOWNLOAD

Misorientation-angle-dependent electrical transport across molybdenum disulfide grain boundaries

DC Field Value Language
dc.contributor.authorThuc Hue Ly-
dc.contributor.authorDavid J. Perello-
dc.contributor.authorJiong Zhao-
dc.contributor.authorDeng, QM-
dc.contributor.authorHyun Kim-
dc.contributor.authorGang Hee Han-
dc.contributor.authorSang Hoon Chae-
dc.contributor.authorHye Yun Jeong-
dc.contributor.authorYoung Hee Lee-
dc.date.available2016-04-21T07:08:42Z-
dc.date.created2016-02-19ko
dc.date.issued2016-01-
dc.identifier.issn2041-1723-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/2462-
dc.description.abstractGrain boundaries in monolayer transition metal dichalcogenides have unique atomic defect structures and band dispersion relations that depend on the inter-domain misorientation angle. Here, we explore misorientation angle-dependent electrical transport at grain boundaries in monolayer MoS2 by correlating the atomic defect structures of measured devices analysed with transmission electron microscopy and first-principles calculations. Transmission electron microscopy indicates that grain boundaries are primarily composed of 5-7 dislocation cores with periodicity and additional complex defects formed at high angles, obeying the classical low-angle theory for angles <22 degrees. The inter-domain mobility is minimized for angles <9 degrees and increases nonlinearly by two orders of magnitude before saturating at similar to 16 cm(2) V-1 s(-1) around misorientation angle approximate to 20 degrees. This trend is explained via grain-boundary electrostatic barriers estimated from density functional calculations and experimental tunnelling barrier heights, which are approximate to 0.5 eV at low angles and approximate to 0.15 eV at high angles (>= 20 degrees)-
dc.description.uri1-
dc.language영어-
dc.publisherNATURE PUBLISHING GROUP-
dc.titleMisorientation-angle-dependent electrical transport across molybdenum disulfide grain boundaries-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000369022600009-
dc.identifier.scopusid2-s2.0-84955444098-
dc.identifier.rimsid22344ko
dc.date.tcdate2018-10-01-
dc.contributor.affiliatedAuthorThuc Hue Ly-
dc.contributor.affiliatedAuthorDavid J. Perello-
dc.contributor.affiliatedAuthorJiong Zhao-
dc.contributor.affiliatedAuthorHyun Kim-
dc.contributor.affiliatedAuthorGang Hee Han-
dc.contributor.affiliatedAuthorSang Hoon Chae-
dc.contributor.affiliatedAuthorHye Yun Jeong-
dc.contributor.affiliatedAuthorYoung Hee Lee-
dc.identifier.doi10.1038/ncomms10426-
dc.identifier.bibliographicCitationNATURE COMMUNICATIONS, v.7, pp.10426-
dc.citation.titleNATURE COMMUNICATIONS-
dc.citation.volume7-
dc.citation.startPage10426-
dc.date.scptcdate2018-10-01-
dc.description.wostc32-
dc.description.scptc37-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusDISLOCATION SCATTERING-
dc.subject.keywordPlusMOS2-
dc.subject.keywordPlusSEMICONDUCTORS-
dc.subject.keywordPlusMOLECULES-
dc.subject.keywordPlusDEFECTS-
dc.subject.keywordPlusBANDGAP-
dc.subject.keywordPlusSCALE-
dc.subject.keywordPlusGAS-
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > 1. Journal Papers (저널논문)
Files in This Item:
나노구조 ncomms 7 10426.pdfDownload

qrcode

  • facebook

    twitter

  • Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
해당 아이템을 이메일로 공유하기 원하시면 인증을 거치시기 바랍니다.

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Browse