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Thickness-dependent electronic structure in ultrathin LaNiO3 films under tensile strain

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Title
Thickness-dependent electronic structure in ultrathin LaNiO3 films under tensile strain
Author(s)
Hyang Keun Yoo; Seung Ill Hyun; Young Jun Chang; Luca Moreschini; Chang Hee Sohn; Hyeong-Do Kim; Aaron Bostwick; Eli Rotenberg; Ji Hoon Shim; Tae Won Noh
Publication Date
2016-01
Journal
PHYSICAL REVIEW B, v.93, no.3, pp.035141
Publisher
AMER PHYSICAL SOC
Abstract
We investigated electronic-structure changes of tensile-strained ultrathin LaNiO3 (LNO) films from ten to one unit cells (UCs) using angle-resolved photoemission spectroscopy (ARPES). We found that there is a critical thickness tc between four and three UCs below which Ni eg electrons are confined in two-dimensional space. Furthermore, the Fermi surfaces (FSs) of LNO films below tc consist of two orthogonal pairs of one-dimensional (1D) straight parallel lines. Such a feature is not accidental as observed in constant-energy surfaces at all binding energies, which is not explained by first-principles calculations or the dynamical mean-field theory. The ARPES spectra also show anomalous spectral behaviors, such as no quasiparticle peak at the Fermi momentum but fast band dispersion comparable to the bare-band one, which is typical in a 1D system. As its possible origin, we propose 1D FS nesting, which also accounts for FS superstructures observed in ARPES. ©2016 American Physical Society
URI
https://pr.ibs.re.kr/handle/8788114/2384
DOI
10.1103/PhysRevB.93.035141
ISSN
2469-9950
Appears in Collections:
Center for Correlated Electron Systems(강상관계 물질 연구단) > 1. Journal Papers (저널논문)
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