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Ferroelectric Single-Crystal Gated Graphene/Hexagonal-BN/Ferroelectric Field-Effect Transistor

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dc.contributor.authorNahee Park-
dc.contributor.authorKang, H.-
dc.contributor.authorJeongmin Park-
dc.contributor.authorYourack Lee-
dc.contributor.authorYoojoo Yun-
dc.contributor.authorLee, J.-H.-
dc.contributor.authorLee, S.-G.-
dc.contributor.authorYoung Hee Lee-
dc.contributor.authorDongseok Suh-
dc.date.available2016-01-25T00:11:41Z-
dc.date.created2015-12-07-
dc.date.issued2015-11-
dc.identifier.issn1936-0851-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/2247-
dc.description.abstractThe effect of a ferroelectric polarization field on the charge transport in a two-dimensional (2D) material was examined using a graphene monolayer on a hexagonal boron nitride (hBN) field-effect transistor (FET) fabricated using a ferroelectric single-crystal substrate, (1-x)[Pb(Mg1/3Nb2/3)O3]-x[PbTiO3] (PMN-PT). In this configuration, the intrinsic properties of graphene were preserved with the use of an hBN flake, and the influence of the polarization field from PMN-PT could be distinguished. During a wide-range gate-voltage (VG) sweep, a sharp inversion of the spontaneous polarization affected the graphene channel conductance asymmetrically as well as an antihysteretic behavior. Additionally, a transition from antihysteresis to normal ferroelectric hysteresis occurred, depending on the VG sweep range relative to the ferroelectric coercive field. We developed a model to interpret the complex coupling among antihysteresis, current saturation, and sudden conductance variation in relation with the ferroelectric switching and the polarization-assisted charge trapping, which can be generalized to explain the combination of 2D structured materials with ferroelectrics. © 2015 American Chemical Society-
dc.description.uri1-
dc.language영어-
dc.publisherAMER CHEMICAL SOC-
dc.subjectantihysteresis-
dc.subjectferroelectric memory-
dc.subjectferroelectric single-crystal-
dc.subjectgraphene transistor-
dc.subjectPMN-PT-
dc.titleFerroelectric Single-Crystal Gated Graphene/Hexagonal-BN/Ferroelectric Field-Effect Transistor-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000365464800020-
dc.identifier.scopusid2-s2.0-84948420072-
dc.identifier.rimsid21737ko
dc.date.tcdate2018-10-01-
dc.contributor.affiliatedAuthorNahee Park-
dc.contributor.affiliatedAuthorJeongmin Park-
dc.contributor.affiliatedAuthorYourack Lee-
dc.contributor.affiliatedAuthorYoojoo Yun-
dc.contributor.affiliatedAuthorYoung Hee Lee-
dc.contributor.affiliatedAuthorDongseok Suh-
dc.identifier.doi10.1021/acsnano.5b04339-
dc.identifier.bibliographicCitationACS NANO, v.9, no.11, pp.10729 - 10736-
dc.citation.titleACS NANO-
dc.citation.volume9-
dc.citation.number11-
dc.citation.startPage10729-
dc.citation.endPage10736-
dc.date.scptcdate2018-10-01-
dc.description.wostc25-
dc.description.scptc21-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusHYBRID STRUCTURES-
dc.subject.keywordPlusTUNNEL-JUNCTIONS-
dc.subject.keywordPlusGRAPHENE-
dc.subject.keywordPlusELECTRONICS-
dc.subject.keywordPlusTRANSPORT-
dc.subject.keywordPlusDEVICES-
dc.subject.keywordAuthorgraphene transistor-
dc.subject.keywordAuthorferroelectric single-crystal-
dc.subject.keywordAuthorPMN-PT-
dc.subject.keywordAuthorferroelectric memory-
dc.subject.keywordAuthorantihysteresis-
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > 1. Journal Papers (저널논문)
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