Temperature dependence of the electronic transitions in BiFeO3 thin film studied by spectroscopic ellipsometry

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Title
Temperature dependence of the electronic transitions in BiFeO3 thin film studied by spectroscopic ellipsometry
Author(s)
Tae Dong Kang; Byung Chul Jeon; Moon S.J.
Publication Date
2015-04
Journal
JOURNAL OF APPLIED PHYSICS, v.117, no.13, pp.134107 -
Publisher
AMER INST PHYSICS
Abstract
The temperature dependence of the electronic response of BiFeO3 thin film grown on a SrTiO3 substrate is investigated using spectroscopic ellipsometry. By analyzing the pseudodielectric function, we identify two d-d crystal field transitions of Fe3+ ions in the energy region between 1 and 2 eV. The d-d transitions show abnormal temperature dependence that cannot be attributed to conventional electron-phonon interactions. The origin of the abnormal temperature dependence is discussed in terms of spin-charge coupling. The temperature dependence of the charge transfer transitions located above 2.5 eV is characterized by standard critical point model analysis of the 2nd derivatives of the dielectric function. This analysis provides detailed information of the critical point parameters for charge transfer transitions. © 2015 AIP Publishing LLC
URI
https://pr.ibs.re.kr/handle/8788114/2060
ISSN
0021-8979
Appears in Collections:
Center for Correlated Electron Systems(강상관계 물질 연구단) > Journal Papers (저널논문)
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