Photoluminescence wavelength variation of monolayer MoS2 by oxygen plasma treatment
DC Field | Value | Language |
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dc.contributor.author | Min Su Kim | - |
dc.contributor.author | Giwoong Nam | - |
dc.contributor.author | Seki Park | - |
dc.contributor.author | Hyun Kim | - |
dc.contributor.author | Gang Hee Han | - |
dc.contributor.author | Jubok Lee | - |
dc.contributor.author | Krishna P. Dhakal | - |
dc.contributor.author | Jae-Young Leem | - |
dc.contributor.author | Young Hee Lee | - |
dc.contributor.author | Jeongyong Kim | - |
dc.date.available | 2016-01-07T09:11:01Z | - |
dc.date.created | 2015-10-14 | - |
dc.date.issued | 2015-09 | - |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/1889 | - |
dc.description.abstract | We performed nanoscale confocal photoluminescence (PL), Raman, and absorption spectral imaging measurements to investigate the optical and structural properties of molybdenum disulfide (MoS2) monolayers synthesized by chemical vapor deposition method and subjected to oxygen plasma treatment for 10 to 120 s under high vacuum(1.3 × 10−3 Pa). Oxygen plasma treatment induced red shifts of ~20 nmin the PL emission peaks corresponding to A and B excitons. Similarly, the peak positions corresponding to A and B excitons of the absorption spectra were red-shifted following oxygen plasma treatment. Based on the confocal PL, absorption, and Raman microscopy results, we suggest that the red-shifting of the A and B exciton peaks originated from shallow defect states generated by oxygen plasma treatment. | - |
dc.description.uri | 1 | - |
dc.language | 영어 | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.subject | Molybdenum disulfide, Wavelength tuning, Oxygen plasma, Confocal photoluminescence microscopy, Confocal absorption microscopy | - |
dc.title | Photoluminescence wavelength variation of monolayer MoS2 by oxygen plasma treatment | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000361057100049 | - |
dc.identifier.scopusid | 2-s2.0-84941420430 | - |
dc.identifier.rimsid | 21385 | ko |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Min Su Kim | - |
dc.contributor.affiliatedAuthor | Seki Park | - |
dc.contributor.affiliatedAuthor | Hyun Kim | - |
dc.contributor.affiliatedAuthor | Gang Hee Han | - |
dc.contributor.affiliatedAuthor | Jubok Lee | - |
dc.contributor.affiliatedAuthor | Krishna P. Dhakal | - |
dc.contributor.affiliatedAuthor | Young Hee Lee | - |
dc.contributor.affiliatedAuthor | Jeongyong Kim | - |
dc.identifier.doi | 10.1016/j.tsf.2015.06.024 | - |
dc.identifier.bibliographicCitation | THIN SOLID FILMS, v.590, pp.318 - 323 | - |
dc.citation.title | THIN SOLID FILMS | - |
dc.citation.volume | 590 | - |
dc.citation.startPage | 318 | - |
dc.citation.endPage | 323 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 9 | - |
dc.description.scptc | 9 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |