Strong anisotropy of ferroelectricity in lead-free bismuth silicate
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Seol, D | - |
dc.contributor.author | Taniguchi, H | - |
dc.contributor.author | Jae-Yeol Hwang | - |
dc.contributor.author | Itoh, M | - |
dc.contributor.author | Shin, H | - |
dc.contributor.author | Sung Wng Kim | - |
dc.contributor.author | Kim, Y | - |
dc.date.available | 2015-09-01T01:20:22Z | - |
dc.date.created | 2015-08-03 | - |
dc.date.issued | 2015-07 | - |
dc.identifier.issn | 2040-3364 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/1804 | - |
dc.description.abstract | Bismuth silicate (Bi2SiO5) was recently suggested as a potential silicate based lead-free ferroelectric material. Here, we show the existence of ferroelectricity and explore the strong anisotropy of local ferroelectricity using piezoresponse force microscopy (PFM). Domain structures are reconstructed using angle-resolved PFM. Furthermore, piezoresponse hysteresis loops and piezoelectric coefficients are spatially investigated at the nanoscale. The obtained results confirm the existence of ferroelectricity with strong c-axis polarization. These results could provide basic information on the anisotropic ferroelectricity in Bi2SiO5 and furthermore suggest its considerable potential for lead-free ferroelectric applications with silicon technologies | - |
dc.language | 영어 | - |
dc.publisher | ROYAL SOC CHEMISTRY | - |
dc.title | Strong anisotropy of ferroelectricity in lead-free bismuth silicate | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000357399600010 | - |
dc.identifier.scopusid | 2-s2.0-84942935617 | - |
dc.identifier.rimsid | 20714 | ko |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Jae-Yeol Hwang | - |
dc.contributor.affiliatedAuthor | Sung Wng Kim | - |
dc.identifier.doi | 10.1039/c5nr03161c | - |
dc.identifier.bibliographicCitation | NANOSCALE, v.7, no.27, pp.11561 - 11565 | - |
dc.relation.isPartOf | NANOSCALE | - |
dc.citation.title | NANOSCALE | - |
dc.citation.volume | 7 | - |
dc.citation.number | 27 | - |
dc.citation.startPage | 11561 | - |
dc.citation.endPage | 11565 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 11 | - |
dc.description.scptc | 10 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | PIEZORESPONSE FORCE MICROSCOPY | - |
dc.subject.keywordPlus | DOMAIN-STRUCTURE | - |
dc.subject.keywordPlus | NANOCAPACITORS | - |
dc.subject.keywordPlus | CRYSTALS | - |