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Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials

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Title
Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials
Author(s)
Suga, Mitsuo; Asahina, Shunsuke; Sakuda, Yusuke; Kazumori, Hiroyoshi; Nishiyama, Hidetoshi; Nokuo, Takeshi; Alfredsson, Viveka; Kjellman, Tomas; Stevens, Sam M.; Cho, Hae Sung; Cho, Minhyung; Han, Lu; Che, Shunai; Anderson, Michael W.; Schueth, Ferdi; Deng, Hexiang; Yaghi, Omar M.; Liu, Zheng; Jeong, Hu Young; Stein, Andreas; Sakamoto, Kazuyuki; Ryong Ryoo; Terasaki, Osamu
Subject
Characterization, ; Crystalline materials, ; Scanning electron microscopy, ; X ray powder diffraction, ; Detection system, ; Hierarchically porous materials, ; High-resolution scanning electron microscopies, ; Mesoporous Silica, ; Metal organic framework, ; Metalorganic frameworks (MOFs), ; Potential barriers, ; Structural details, ; Mesoporous materials
Publication Date
2014-05
Journal
PROGRESS IN SOLID STATE CHEMISTRY, v.42, no.1-2, pp.1 - 21
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Abstract
Research concerning nano-materials (metal-organic frameworks (MOFs), zeolites, mesoporous silicas, etc.) and the nano-scale, including potential barriers for the particulates to diffusion to/from is of increasing importance to the understanding of the catalytic utility of porous materials when combined with any potential super structures (such as hierarchically porous materials). However, it is difficult to characterize the structure of for example MOFs via X-ray powder diffraction because of the serious overlapping of reflections caused by their large unit cells, and it is also difficult to directly observe the opening of surface pores using ordinary methods. Electron-microscopic methods including high-resolution scanning electron microscopy (HRSEM) have therefore become imperative for the above challenges. Here, we present the theory and practical application of recent advances such as through-the-lens detection systems, which permit a reduced landing energy and the selection of high-resolution, topographically specific emitted electrons, even from electrically insulating nano-materials. © 2014 Elsevier Ltd. All rights reserved.
URI
https://pr.ibs.re.kr/handle/8788114/1512
DOI
10.1016/j.progsolidstchem.2014.02.001
ISSN
0079-6786
Appears in Collections:
Center for Nanomaterials and Chemical Reactions(나노물질 및 화학반응 연구단) > 1. Journal Papers (저널논문)
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