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나노물질 및 화학반응 연구단
나노물질 및 화학반응 연구단
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Microstructural characterization and formation mechanism of 21° top facets of ZnO-based nanowall structures

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Title
Microstructural characterization and formation mechanism of 21° top facets of ZnO-based nanowall structures
Author(s)
Ju Ho Lee; Kim D.C.; Sang Yun Kim; Choi S.; Lee K.-H.; Jeong Yong Lee; Koun Cho H.
Publication Date
2013-03
Journal
PHYSICA B-CONDENSED MATTER, v.412, no., pp.12 - 16
Publisher
ELSEVIER SCIENCE BV
Abstract
This study reports the microstructural characterization and formation mechanism of the 21° top facets of ZnO-based nanowall structures. The ZnO-based nanowall structures reported previously by many other research groups have {112̄0} planes as major planes and top facets with a specific angle in common, irrespective of the growth techniques and growth conditions. These nanowalls were found to exist between two adjacent nanowires with a c-axis preferred orientation, and the atoms at the junction of the nanowalls and nanowires perfectly coincided with each other at an atomic level, without any defects. The top facets of the nanowalls showed periodically stepped surfaces and were identified as {011̄5} planes, which were perpendicular to the {112̄0} major planes. On the basis of the microstructural characterization of the synthesized ZnO-based nanowall structures, the formation mechanism and atomic structure model of the 21° top facets of the nanowall structures are proposed. © 2012 Elsevier B.V.
URI
https://pr.ibs.re.kr/handle/8788114/1373
ISSN
0921-4526
Appears in Collections:
Center for Nanomaterials and Chemical Reactions(나노물질 및 화학반응 연구단) > Journal Papers (저널논문)
Files in This Item:
27_IBS CA1201-3_Physica B - Condensed Matter_412-01_12.pdfDownload

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