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Understanding filamentary growth and rupture by Ag ion migration through single-crystalline 2D layered CrPS4

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Title
Understanding filamentary growth and rupture by Ag ion migration through single-crystalline 2D layered CrPS4
Author(s)
Lee, Mi Jung; Kim, Sung-Hoon; Lee, Sangik; Yoon, Chansoo; Min, Kyung-Ah; Choi, Hyunsoo; Hong, Suklyun; Sungmin Lee; Je-Geun Park; Ahn, Jae-Pyoung; Park, Bae Ho
Publication Date
2020-12
Journal
NPG ASIA MATERIALS, v.12, no.1
Publisher
NATURE RESEARCH
Abstract
Memristive electrochemical metallization (ECM) devices based on cation migration and electrochemical metallization in solid electrolytes are considered promising for neuromorphic computing systems. Two-dimensional (2D) layered materials are emerging as potential candidates for electrolytes in reliable ECM devices due to their two-dimensionally confined material properties. However, electrochemical metallization within a single-crystalline 2D layered material has not yet been verified. Here, we use transmission electron microscopy and energy-dispersive X-ray spectroscopy to investigate the resistive switching mechanism of an ECM device containing a single-crystalline 2D layered CrPS4 electrolyte. We observe the various conductive filament (CF) configurations induced by an applied voltage in an Ag/ CrPS4/Au device in the initial/low-resistance/high-resistance/breakdown states. These observations provide concrete experimental evidence that CFs consisting of Ag metal can be formed inside single-crystalline 2D layered CrPS4 and that their configuration can be changed by an applied voltage. Density functional theory calculations confirm that the sulfur vacancies in single-crystalline CrPS4 can facilitate Ag ion migration from the active electrode layer. The electrically induced changes in Ag CFs inside single-crystalline 2D layered CrPS4 raise the possibility of a reliable ECM device that exploits the properties of two-dimensionally confined materials.
URI
https://pr.ibs.re.kr/handle/8788114/12179
DOI
10.1038/s41427-020-00272-x
ISSN
1884-4049
Appears in Collections:
Center for Correlated Electron Systems(강상관계 물질 연구단) > 1. Journal Papers (저널논문)
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