Operation of a wet near-field scanning optical microscope in stable zones by minimizing the resonance change of tuning forks
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kyoung-Duck Park | - |
dc.contributor.author | Doo Jae Park | - |
dc.contributor.author | Seung Gol Lee | - |
dc.contributor.author | Geunchang Choi | - |
dc.contributor.author | Dai-Sik Kim | - |
dc.contributor.author | Clare Chisu Byeon | - |
dc.contributor.author | Soo Bong Choi | - |
dc.contributor.author | Mun Seok Jeong | - |
dc.date.available | 2015-04-20T06:17:46Z | - |
dc.date.created | 2014-08-11 | - |
dc.date.issued | 2014-02 | - |
dc.identifier.issn | 0957-4484 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/1139 | - |
dc.description.abstract | A resonant shift and a decrease of resonance quality of a tuning fork attached to a conventional fiber optic probe in the vicinity of liquid is monitored systematically while varying the protrusion length and immersion depth of the probe. Stable zones where the resonance modification as a function of immersion depth is minimized are observed. A wet nearfield scanning optical microscope (wetNSOM) is operated for a sample within water by using such a stable zone. | - |
dc.language | 영어 | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.subject | snom, NSOM, near-field,tuning fork,scanning probe microscopy | - |
dc.title | Operation of a wet near-field scanning optical microscope in stable zones by minimizing the resonance change of tuning forks | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000331137200011 | - |
dc.identifier.scopusid | 2-s2.0-84893113305 | - |
dc.identifier.rimsid | 418 | ko |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Kyoung-Duck Park | - |
dc.contributor.affiliatedAuthor | Doo Jae Park | - |
dc.contributor.affiliatedAuthor | Mun Seok Jeong | - |
dc.identifier.doi | 10.1088/0957-4484/25/7/075704 | - |
dc.identifier.bibliographicCitation | NANOTECHNOLOGY, v.25, no.7, pp.75704 | - |
dc.relation.isPartOf | NANOTECHNOLOGY | - |
dc.citation.title | NANOTECHNOLOGY | - |
dc.citation.volume | 25 | - |
dc.citation.number | 7 | - |
dc.citation.startPage | 75704 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 4 | - |
dc.description.scptc | 4 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | Nearfield | - |
dc.subject.keywordAuthor | NSOM | - |
dc.subject.keywordAuthor | Scanning probe microscopy | - |
dc.subject.keywordAuthor | Snom | - |
dc.subject.keywordAuthor | Tuning fork | - |