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Shin, Yun Chang

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액시온 및 극한상호작용 연구단

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Publication Date Title Author(s)
2020-05 Analysis method for detecting topological defect dark matter with a global magnetometer network Masia-Roig H.; Smiga J.A.; Budker D.; Dumont V.; Grujic Z.; Dongok Kim; Jackson Kimball D.F.; Lebedev V.; Monroy M.; Pustelny S.; Scholtes T.; Segura P.C.; YannisK.Semertzidis; YunChangShin; Stalnaker J.E.; Sulai I.; Weis A.; Wickenbrock A.; Dongok Kim; YannisK.Semertzidis; YunChangShin
2019-12 Effective approximation of electromagnetism for axion haloscope searches Younggeun Kim; Dongok Kim; Junu Jeong; Jinsu Kim; Yun Chang Shin; Yannis K. Semertzidis; Younggeun Kim; Yun Chang Shin; Yannis K. Semertzidis
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