Flexoelectric control of defect formation in ferroelectric epitaxial thin films
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Daesu Lee | - |
dc.contributor.author | Byung Chul Jeon | - |
dc.contributor.author | Aram Yoon | - |
dc.contributor.author | Yeong Jae Shin | - |
dc.contributor.author | Myang Hwan Lee | - |
dc.contributor.author | Tae Kwon Song | - |
dc.contributor.author | Sang Don Bu | - |
dc.contributor.author | Miyoung Kim | - |
dc.contributor.author | Jin-Seok Chung | - |
dc.contributor.author | Jong-Gul Yoon | - |
dc.contributor.author | Tae Won Noh | - |
dc.date.available | 2015-04-20T05:36:40Z | - |
dc.date.created | 2014-11-24 | - |
dc.date.issued | 2014-08 | - |
dc.identifier.issn | 0935-9648 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/944 | - |
dc.description.abstract | © 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim | - |
dc.description.uri | 1 | - |
dc.language | 영어 | - |
dc.publisher | WILEY-V C H VERLAG GMBH | - |
dc.title | Flexoelectric control of defect formation in ferroelectric epitaxial thin films | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000340500700016 | - |
dc.identifier.scopusid | 2-s2.0-84905457168 | - |
dc.identifier.rimsid | 16466 | ko |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Daesu Lee | - |
dc.contributor.affiliatedAuthor | Byung Chul Jeon | - |
dc.contributor.affiliatedAuthor | Yeong Jae Shin | - |
dc.contributor.affiliatedAuthor | Tae Won Noh | - |
dc.identifier.doi | 10.1002/adma.201400654 | - |
dc.identifier.bibliographicCitation | ADVANCED MATERIALS, v.26, no.29, pp.5005 - 5011 | - |
dc.citation.title | ADVANCED MATERIALS | - |
dc.citation.volume | 26 | - |
dc.citation.number | 29 | - |
dc.citation.startPage | 5005 | - |
dc.citation.endPage | 5011 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 36 | - |
dc.description.scptc | 33 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | defect engineering | - |
dc.subject.keywordAuthor | epitaxial thin film | - |
dc.subject.keywordAuthor | ferroelectric | - |
dc.subject.keywordAuthor | flexoelectric | - |
dc.subject.keywordAuthor | strain gradient | - |