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Yukiaki, Ishida
강상관계 물질 연구단
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Work function seen with sub-meV precision through laser photoemission

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dc.contributor.authorYukiaki Ishida-
dc.contributor.authorJong Keun Jung-
dc.contributor.authorMinsoo Kim-
dc.contributor.authorJunyoung Kwon-
dc.contributor.authorYounsik Kim-
dc.contributor.authorChung, D-
dc.contributor.authorInkyung Song-
dc.contributor.authorChangyoung Kim-
dc.contributor.authorOtsu, T-
dc.contributor.authorKobayashi, Y-
dc.date.accessioned2020-12-22T02:46:05Z-
dc.date.accessioned2020-12-22T02:46:05Z-
dc.date.available2020-12-22T02:46:05Z-
dc.date.available2020-12-22T02:46:05Z-
dc.date.created2020-10-16-
dc.date.issued2020-09-
dc.identifier.issn2399-3650-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/7648-
dc.description.abstractElectron emission can be utilised to measure the work function of the surface. However, the number of significant digits in the values obtained through thermionic-, field- and photo-emission techniques is typically just two or three. Here, we show that the number can go up to five when angle-resolved photoemission spectroscopy (ARPES) is applied. This owes to the capability of ARPES to detect the slowest photoelectrons that are directed only along the surface normal. By using a laser-based source, we optimised our setup for the slow photoelectrons and resolved the slowest-end cutoff of Au(111) with the sharpness not deteriorated by the bandwidth of light nor by Fermi-Dirac distribution. The work function was leveled within +/- 0.4 meV at least from 30 to 90 K and the surface aging was discerned as a meV shift of the work function. Our study opens the investigations into the fifth significant digit of the work function. The work function is a fundamental quantity applied to many aspects of physics and describes the minimum energy required to remove an electron from the surface of a metal and eject it into the vacuum. Here, the authors demonstrate a method to determine the work function to five significant figures, a higher order of magnitude than previously reported-
dc.description.uri1-
dc.language영어-
dc.publisherNATURE RESEARCH-
dc.subjectCONTACT POTENTIAL DIFFERENCE-
dc.subjectTEMPERATURE-DEPENDENCE-
dc.subjectMETAL-SURFACES-
dc.subjectGOLD-
dc.subjectCONTAMINATION-
dc.titleWork function seen with sub-meV precision through laser photoemission-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000571864700002-
dc.identifier.scopusid2-s2.0-85090855191-
dc.identifier.rimsid73222-
dc.contributor.affiliatedAuthorYukiaki Ishida-
dc.contributor.affiliatedAuthorJong Keun Jung-
dc.contributor.affiliatedAuthorMinsoo Kim-
dc.contributor.affiliatedAuthorJunyoung Kwon-
dc.contributor.affiliatedAuthorYounsik Kim-
dc.contributor.affiliatedAuthorInkyung Song-
dc.contributor.affiliatedAuthorChangyoung Kim-
dc.identifier.doi10.1038/s42005-020-00426-x-
dc.identifier.bibliographicCitationCOMMUNICATIONS PHYSICS, v.3, no.1, pp.158-
dc.citation.titleCOMMUNICATIONS PHYSICS-
dc.citation.volume3-
dc.citation.number1-
dc.citation.startPage158-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusCONTACT POTENTIAL DIFFERENCE-
dc.subject.keywordPlusTEMPERATURE-DEPENDENCE-
dc.subject.keywordPlusMETAL-SURFACES-
dc.subject.keywordPlusGOLD-
dc.subject.keywordPlusCONTAMINATION-
Appears in Collections:
Center for Correlated Electron Systems(강상관계 물질 연구단) > 1. Journal Papers (저널논문)
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