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Mapping Graphene Grain Orientation by the Growth of WS2 Films with Oriented Cracks

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Title
Mapping Graphene Grain Orientation by the Growth of WS2 Films with Oriented Cracks
Author(s)
Seon Joon Kim; Da Luo; Kangho Park; Myeonggi Choe; Dae Woo Kim; Meihui Wang; Woo-Bin Jung; Zonghoon Lee; Rodney S. Ruoff; Hee-Tae Jung
Subject
Thickness, Grain, Two dimensional materials, Lattices, Chemical vapor deposition
Publication Date
2020-09
Journal
CHEMISTRY OF MATERIALS, v.32, no.17, pp.7484 - 7491
Publisher
AMER CHEMICAL SOC
Abstract
© 2020 American Chemical Society. We map the lattice orientation of graphene grains (domains) larger than a centimeter by measuring the orientation of cracks in a WS2 film grown on graphene that had been previously grown by chemical vapor deposition (CVD) on Cu foils. A WO3 film was first deposited on the graphene film and then converted to a WS2 film by CVD sulfurization. The WS2 film was found to contain cracks that, as found by electron diffraction and optical birefringence, are always aligned along the armchair direction of the graphene lattice. We find that this method is significantly advanced compared to any published methods for the analysis of the grain structure, as it provides simultaneous and high-contrast mapping of grain orientation without needing further analysis
URI
https://pr.ibs.re.kr/handle/8788114/7644
DOI
10.1021/acs.chemmater.0c02551
ISSN
0897-4756
Appears in Collections:
Center for Multidimensional Carbon Materials(다차원 탄소재료 연구단) > 1. Journal Papers (저널논문)
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