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다차원 탄소재료 연구단
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Reference-free THz-TDS conductivity analysis of thin conducting films

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Title
Reference-free THz-TDS conductivity analysis of thin conducting films
Author(s)
Patrick R. Whelan; Qian Shen; Da Luo; Meihui Wang; Rodney S. Ruoff; Peter U. Jepsen; Peter Bøggild; Binbin Zhou
Subject
TIME-DOMAIN SPECTROSCOPY, ; REFRACTIVE-INDEX, ; TERAHERTZ, ; GRAPHENE
Publication Date
2020-09
Journal
OPTICS EXPRESS, v.28, no.20, pp.28819 - 28830
Publisher
OPTICAL SOC AMER
Abstract
© 2020 Optical Society of America. We present a reference-free method to determine electrical parameters of thin conducting films by steady state transmission-mode terahertz time-domain spectroscopy (THz-TDS). We demonstrate that the frequency-dependent AC conductivity of graphene can be acquired by comparing the directly transmitted THz pulse with a transient internal reflection within the substrate which avoids the need for a standard reference scan. The DC sheet conductivity, scattering time, carrier density, mobility, and Fermi velocity of graphene are retrieved subsequently by fitting the AC conductivity with the Drude model. This reference-free method was investigated with two complementary THz setups: one commercial fibre-coupled THz spectrometer with fast scanning rate (0.2-1.5 THz) and one air-plasma based ultra-broadband THz spectrometer for greatly extended frequency range (2-10 THz). Certain propagation correction terms for more accurate retrieval of electrical parameters are discussed
URI
https://pr.ibs.re.kr/handle/8788114/7629
DOI
10.1364/OE.402447
ISSN
1094-4087
Appears in Collections:
Center for Multidimensional Carbon Materials(다차원 탄소재료 연구단) > 1. Journal Papers (저널논문)
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