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나노구조물리연구단
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Industrial Applications of Electron Micriscopy

DC Field Value Language
dc.contributor.author이영희-
dc.date.accessioned2020-12-16T09:33:48Z-
dc.date.accessioned2020-12-16T09:33:48Z-
dc.date.available2020-12-16T09:33:48Z-
dc.date.available2020-12-16T09:33:48Z-
dc.date.issued2002-12-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/7482-
dc.format.extent500-
dc.languageENG-
dc.publisherMarcel Dekker-
dc.titleIndustrial Applications of Electron Micriscopy-
dc.typeBook-
dc.type.rimsBOOK-
dc.identifier.rimsid138-
dc.contributor.affiliatedAuthor이영희-
dc.identifier.bibliographicCitationMarcel Dekker, 500 p-
dc.type.docType저서-
Appears in Collections:
Center for Integrated Nanostructure Physics(나노구조물리 연구단) > 2. Books & Book Chapters (저역서)
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