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Fabrication and Imaging of Monolayer Phosphorene with Preferred Edge Configurations via Graphene-Assisted Layer-by-Layer Thinning

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dc.contributor.authorYangjin Lee-
dc.contributor.authorSol Lee-
dc.contributor.authorJun-Yeong Yoon-
dc.contributor.authorJinwoo Cheon-
dc.contributor.authorHu Young Jeong-
dc.contributor.authorKwanpyo Kim-
dc.date.available2020-03-18T08:17:40Z-
dc.date.created2020-01-07-
dc.date.issued2020-01-
dc.identifier.issn1530-6984-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/7019-
dc.description.abstract© 2019 American Chemical Society.Phosphorene, a monolayer of black phosphorus (BP), is an elemental two-dimensional material with interesting physical properties, such as high charge carrier mobility and exotic anisotropic in-plane properties. To fundamentally understand these various physical properties, it is critically important to conduct an atomic-scale structural investigation of phosphorene, particularly regarding various defects and preferred edge configurations. However, it has been challenging to investigate mono- and few-layer phosphorene because of technical difficulties arising in the preparation of a high-quality sample and damages induced during the characterization process. Here, we successfully fabricate high-quality monolayer phosphorene using a controlled thinning process with transmission electron microscopy and subsequently perform atomic-resolution imaging. Graphene protection suppresses the e-beam-induced damage to multilayer BP and one-side graphene protection facilitates the layer-by-layer thinning of the samples, rendering high-quality monolayer and bilayer regions. We also observe the formation of atomic-scale crystalline edges predominantly aligned along the zigzag and (101) terminations, which is originated from edge kinetics under e-beam-induced sputtering process. Our study demonstrates a new method to image and precisely manipulate the thickness and edge configurations of air-sensitive two-dimensional materials-
dc.description.uri1-
dc.language영어-
dc.publisherAMER CHEMICAL SOC-
dc.subjectaberration-corrected TEM imaging-
dc.subjectcrystalline edge structure-
dc.subjectgraphene protection-
dc.subjectPhosphorene-
dc.titleFabrication and Imaging of Monolayer Phosphorene with Preferred Edge Configurations via Graphene-Assisted Layer-by-Layer Thinning-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000507151600072-
dc.identifier.scopusid2-s2.0-85076247998-
dc.identifier.rimsid70907-
dc.contributor.affiliatedAuthorYangjin Lee-
dc.contributor.affiliatedAuthorSol Lee-
dc.contributor.affiliatedAuthorJun-Yeong Yoon-
dc.contributor.affiliatedAuthorJinwoo Cheon-
dc.contributor.affiliatedAuthorKwanpyo Kim-
dc.identifier.doi10.1021/acs.nanolett.9b04292-
dc.identifier.bibliographicCitationNANO LETTERS, v.20, no.1, pp.559 - 566-
dc.citation.titleNANO LETTERS-
dc.citation.volume20-
dc.citation.number1-
dc.citation.startPage559-
dc.citation.endPage566-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusBLACK PHOSPHORUS-
dc.subject.keywordPlusRADIATION-DAMAGE-
dc.subject.keywordPlusSEMICONDUCTOR-
dc.subject.keywordPlusVACANCIES-
dc.subject.keywordPlusSTRAIN-
dc.subject.keywordAuthorPhosphorene-
dc.subject.keywordAuthoraberration-corrected TEM imaging-
dc.subject.keywordAuthorcrystalline edge structure-
dc.subject.keywordAuthorgraphene protection-
Appears in Collections:
Center for Nanomedicine (나노의학 연구단) > 1. Journal Papers (저널논문)
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