Volatile two-dimensional electron gas in ultrathin BaTiO3 films
DC Field | Value | Language |
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dc.contributor.author | Lutz P. | - |
dc.contributor.author | Moser S. | - |
dc.contributor.author | Jovic V. | - |
dc.contributor.author | Chang Y.J. | - |
dc.contributor.author | Koch R.J. | - |
dc.contributor.author | Ulstrup S. | - |
dc.contributor.author | Ji Seop Oh | - |
dc.contributor.author | Moreschini L. | - |
dc.contributor.author | Fatale S. | - |
dc.contributor.author | Grioni M. | - |
dc.contributor.author | Jozwiak C. | - |
dc.contributor.author | Bostwick A. | - |
dc.contributor.author | Rotenberg E. | - |
dc.contributor.author | Bentmann H. | - |
dc.contributor.author | Reinert F. | - |
dc.date.available | 2019-01-30T02:01:20Z | - |
dc.date.created | 2019-01-15 | - |
dc.date.issued | 2018-09 | - |
dc.identifier.issn | 2475-9953 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/5431 | - |
dc.description.abstract | We investigate the metallic surface state in ultrathin films of BaTiO3 by angle-resolved photoemission spectroscopy. We find Fermi-surface contours derived from the Ti 3dt2g conduction band, similar as in SrTiO3 but with broader spectral features due to enhanced quasiparticle scattering. Oxygen vacancies created in the x-ray beam spot allow for reversible in situ doping control up to surface carrier densities as high as 1014cm-2, but vacancy migration into the subsurface at T��285K quenches the surface state. Our analysis suggests that the charge state of oxygen vacancies in ultrathin films is predominantly 2+, which limits charge-carrier trapping and the formation of localized defect states. ? 2018 American Physical Society | - |
dc.description.uri | 1 | - |
dc.language | 영어 | - |
dc.publisher | AMER PHYSICAL SOC | - |
dc.title | Volatile two-dimensional electron gas in ultrathin BaTiO3 films | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000446295400004 | - |
dc.identifier.scopusid | 2-s2.0-85059699600 | - |
dc.identifier.rimsid | 66710 | - |
dc.contributor.affiliatedAuthor | Ji Seop Oh | - |
dc.identifier.doi | 10.1103/PhysRevMaterials.2.094411 | - |
dc.identifier.bibliographicCitation | PHYSICAL REVIEW MATERIALS, v.2, no.9, pp.094411-1 - 094411-5 | - |
dc.citation.title | PHYSICAL REVIEW MATERIALS | - |
dc.citation.volume | 2 | - |
dc.citation.number | 9 | - |
dc.citation.startPage | 094411-1 | - |
dc.citation.endPage | 094411-5 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |