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Electronic structure change of NiS2-x Se (x) in the metal-insulator transition probed by X-ray absorption spectroscopy

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dc.contributor.authorJinwon Jeong-
dc.contributor.authorKyung Ja Park-
dc.contributor.authorEn-Jin Cho-
dc.contributor.authorHan-Jin Noh-
dc.contributor.authorSung Baek Kim-
dc.contributor.authorHyeong-Do Kim-
dc.date.available2018-07-18T02:06:49Z-
dc.date.created2018-01-23-
dc.date.issued2018-01-
dc.identifier.issn0374-4884-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/4697-
dc.description.abstractThe electronic structure change of NiS2-x Se (x) as a function of Se concentration x has been studied by Ni L-edge X-ray absorption spectroscopy (XAS). The XAS spectra show distinct features in Ni L (3) edge, indicating whether the system is insulating or metallic. These features can be semi-quantitatively explained within the framework of the configurational interaction cluster model (CICM). In the S-rich region, relatively large charge-transfer energy (Delta similar to 5 eV) from ligand p to Ni 3d states and a little small p-d hybridization strength (V (pd sigma) similar to 1.1 eV) can reproduce the experimental spectra in the CICM calculation, and vice versa in the Se-rich region. Our analysis result is consistent with the Zaanen-Sawatzky-Allen scheme that the systems in S-rich side (x <= 0.5) are a charge transfer insulator. However, it also requires that the Delta value must change abruptly in spite of the small change of x near x = 0.5. As a possible microscopic origin, we propose a percolation scenario where a long range connection of Ni[(S,Se)(2)](6) octahedra with Se-Se dimers plays a key role to gap closure. 2018 The Korean Physical Society-
dc.description.uri1-
dc.language영어-
dc.publisherKOREAN PHYSICAL SOC-
dc.subjectMetal-insulator transition-
dc.subjectConductivity of transition-metal compounds-
dc.subjectX-ray absorption spectroscopy-
dc.subjectPercolation-
dc.titleElectronic structure change of NiS2-x Se (x) in the metal-insulator transition probed by X-ray absorption spectroscopy-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000419615800018-
dc.identifier.scopusid2-s2.0-85040030384-
dc.identifier.rimsid61954-
dc.contributor.affiliatedAuthorHyeong-Do Kim-
dc.identifier.doi10.3938/jkps.72.111-
dc.identifier.bibliographicCitationJOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.72, no.1, pp.111 - 115-
dc.citation.titleJOURNAL OF THE KOREAN PHYSICAL SOCIETY-
dc.citation.volume72-
dc.citation.number1-
dc.citation.startPage111-
dc.citation.endPage115-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.subject.keywordPlusELECTRICAL-PROPERTIES-
dc.subject.keywordPlusPHOTOEMISSION-
dc.subject.keywordPlusSYSTEMS-
dc.subject.keywordPlusFIELD-
dc.subject.keywordAuthorMetal-insulator transition-
dc.subject.keywordAuthorConductivity of transition-metal compounds-
dc.subject.keywordAuthorX-ray absorption spectroscopy-
dc.subject.keywordAuthorPercolation-
Appears in Collections:
Center for Correlated Electron Systems(강상관계 물질 연구단) > 1. Journal Papers (저널논문)
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