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A New Analytical Method for Extracting Precise Structural Parameters of Epitaxial Graphene from Moire Patterns

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Title
A New Analytical Method for Extracting Precise Structural Parameters of Epitaxial Graphene from Moire Patterns
Author(s)
Hyunseob Lim; Hyun Jin Yang; Yousoo Kim
Publication Date
2016-12
Journal
ADVANCED MATERIALS INTERFACES, v.3, no.24, pp.1600826 -
Publisher
WILEY
Abstract
A new analytical method to determine the most important two parameters, rotational angle (R theta) and strain (Delta a(Gr)/a(Gr)) of graphene on metal substrate, from scanning tunneling microscope images is presented. Epitaxial graphene on Ir(111) and Pt(111) was investigated by this method, which demonstrates that rotational angle and strain are not independent factors. Rather, these components influence each other to stabilize the graphene-metal interaction thermodynamically. © 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
URI
https://pr.ibs.re.kr/handle/8788114/3779
ISSN
2196-7350
Appears in Collections:
Center for Multidimensional Carbon Materials(다차원 탄소재료 연구단) > Journal Papers (저널논문)
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7. Lim_et_al-2016-Advanced_Materials_Interfaces.pdfDownload

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