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나노물질및화학반응연구단
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Ultraflat Au nanoplates as a new building block for molecular electronics

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dc.contributor.authorWooseok Jeong-
dc.contributor.authorLee M.-
dc.contributor.authorHyunsoo Lee-
dc.contributor.authorLee H.-
dc.contributor.authorKim B.-
dc.contributor.authorJeong Young Park-
dc.date.available2016-07-19T07:40:02Z-
dc.date.created2016-05-17-
dc.date.issued2016-05-
dc.identifier.issn0957-4484-
dc.identifier.urihttps://pr.ibs.re.kr/handle/8788114/2675-
dc.description.abstractWe demonstrate the charge transport properties of a self-assembled organic monolayer on Au nanoplates with conductive probe atomic force microscopy (CP-AFM). Atomically flat Au nanoplates, a few hundred micrometers on each side, that have only (111) surfaces, were synthesized using the chemical vapor transport method; these nanoplates were employed as the substrates for hexadecanethiol (HDT) self-assembled monolayers (SAMs). Atomic-scale highresolution images show (√3×√3 )R30 molecular periodicity, indicating a well-ordered structure of the HDT on the Au nanoplates. We observed reduced friction and adhesion forces on the HDT SAMs on Au nanoplates, compared with Si substrates, which is consistent with th lubricating nature of HDT SAMs. The electrical properties, such as I-VV characteristics and current as a function of load, were measured using CP-AFM. We obtained a tunneling decay constant (β) of 0.57 Å-1, including through-bond (βtb=0.99 Å-1) and through-space ((βtb=1.36 Å-1)) decay constants for the two-pathway model. This indicates that the charge transport properties of HDT SAMs on Au nanoplates are consistent with those on a Au (111) film, suggesting that SAMs on nanoplates can provide a new building block for molecular electronics. © 2016 IOP Publishing Ltd-
dc.description.uri1-
dc.language영어-
dc.publisherIOP PUBLISHING LTD-
dc.subjectAu nanoplate-
dc.subjectcharge transport-
dc.subjectconductive probe atomic force microscopy-
dc.subjectself-assembled monolayer-
dc.titleUltraflat Au nanoplates as a new building block for molecular electronics-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.wosid000374507600014-
dc.identifier.scopusid2-s2.0-84964749485-
dc.identifier.rimsid55460ko
dc.date.tcdate2018-10-01-
dc.contributor.affiliatedAuthorWooseok Jeong-
dc.contributor.affiliatedAuthorHyunsoo Lee-
dc.contributor.affiliatedAuthorJeong Young Park-
dc.identifier.doi10.1088/0957-4484/27/21/215601-
dc.identifier.bibliographicCitationNANOTECHNOLOGY, v.27, no.21, pp.215601-
dc.citation.titleNANOTECHNOLOGY-
dc.citation.volume27-
dc.citation.number21-
dc.citation.startPage215601-
dc.date.scptcdate2018-10-01-
dc.description.wostc1-
dc.description.scptc7-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordAuthorAu nanoplate-
dc.subject.keywordAuthorcharge transport-
dc.subject.keywordAuthorconductive probe atomic force microscopy-
dc.subject.keywordAuthorself-assembled monolayer-
Appears in Collections:
Center for Nanomaterials and Chemical Reactions(나노물질 및 화학반응 연구단) > 1. Journal Papers (저널논문)
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