Domain wall conductivity in semiconducting hexagonal ferroelectric TbMnO3 thin films
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Dong Jik Kim | - |
dc.contributor.author | Connell J.G. | - |
dc.contributor.author | Seo S.S.A. | - |
dc.contributor.author | Gruverman A. | - |
dc.date.available | 2016-05-12T08:53:07Z | - |
dc.date.created | 2016-04-18 | - |
dc.date.issued | 2016-04 | - |
dc.identifier.issn | 0957-4484 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/2481 | - |
dc.description.abstract | Although enhanced conductivity of ferroelectric domain boundaries has been found in BiFeO3 and Pb(Zr,Ti)O3 films as well as hexagonal rare-earth manganite single crystals, the mechanism of the domain wall conductivity is still under debate. Using conductive atomic force microscopy, we observe enhanced conductance at the electrically-neutral domain walls in semiconducting hexagonal ferroelectric TbMnO3 thin films where the structure and polarization direction are strongly constrained along the c-axis. This result indicates that domain wall conductivity in ferroelectric rare-earth manganites is not limited to charged domain walls. We show that the observed conductivity in the TbMnO3 films is governed by a single conduction mechanism, namely, the back-to-back Schottky diodes tuned by the segregation of defects. © 2016 IOP Publishing Ltd | - |
dc.description.uri | 1 | - |
dc.language | 영어 | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.subject | back-to-back Schottky barrier | - |
dc.subject | conductive atomic force microscopy | - |
dc.subject | domain wall conductivity | - |
dc.subject | ferroelectric | - |
dc.subject | hexagonal manganite | - |
dc.subject | semiconducting | - |
dc.title | Domain wall conductivity in semiconducting hexagonal ferroelectric TbMnO3 thin films | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000371343500017 | - |
dc.identifier.scopusid | 2-s2.0-84960081315 | - |
dc.identifier.rimsid | 55133 | - |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Dong Jik Kim | - |
dc.identifier.doi | 10.1088/0957-4484/27/15/155705 | - |
dc.identifier.bibliographicCitation | NANOTECHNOLOGY, v.27, no.15, pp.155705 | - |
dc.citation.title | NANOTECHNOLOGY | - |
dc.citation.volume | 27 | - |
dc.citation.number | 15 | - |
dc.citation.startPage | 155705 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 2 | - |
dc.description.scptc | 2 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | back-to-back Schottky barrier | - |
dc.subject.keywordAuthor | conductive atomic force microscopy | - |
dc.subject.keywordAuthor | domain wall conductivity | - |
dc.subject.keywordAuthor | ferroelectric | - |
dc.subject.keywordAuthor | hexagonal manganite | - |
dc.subject.keywordAuthor | semiconducting | - |