Support-Free Transfer of Ultrasmooth Graphene Films Facilitated by Self-Assembled Monolayers for Electronic Devices and Patterns
DC Field | Value | Language |
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dc.contributor.author | Bin Wang | - |
dc.contributor.author | Ming Huang | - |
dc.contributor.author | Li Tao | - |
dc.contributor.author | Sun Hwa Lee | - |
dc.contributor.author | A-Rang Jang | - |
dc.contributor.author | Bao-Wen Li | - |
dc.contributor.author | Hyeon Suk Shin | - |
dc.contributor.author | Deji Akinwande | - |
dc.contributor.author | Rodney S. Ruoff | - |
dc.date.available | 2016-03-07T06:36:37Z | - |
dc.date.created | 2016-02-19 | - |
dc.date.issued | 2016-01 | - |
dc.identifier.issn | 1936-0851 | - |
dc.identifier.uri | https://pr.ibs.re.kr/handle/8788114/2408 | - |
dc.description.abstract | We explored a support-free method for transferring large area graphene films grown by chemical vapor deposition to various fluoric self-assembled mono layer (F-SAM) modified substrates including SiO2/Si wafers, polyethylene terephthalate films, and glass. This method yields clean, ultrasmooth, and high-quality graphene films for promising applications such as transparent, conductive, and flexible films due to the absence of residues and limited structural defects such as cracks. The F-SAM introduced in the transfer process can also lead to graphene transistors with enhanced field-effect mobility (up to 10,663 cm(2)/Vs) and resistance modulation (up to 12x) on a standard silicon dioxide dielectric. Clean graphene patterns can be realized by transfer of graphene onto only the F-SAM modified surfaces © 2015 American Chemical Society | - |
dc.description.uri | 1 | - |
dc.language | 영어 | - |
dc.publisher | AMER CHEMICAL SOC | - |
dc.subject | graphene | - |
dc.subject | self-assembled monolayer | - |
dc.subject | transfer | - |
dc.subject | support-free | - |
dc.subject | ultrasmooth | - |
dc.subject | GFET | - |
dc.subject | pattern | - |
dc.title | Support-Free Transfer of Ultrasmooth Graphene Films Facilitated by Self-Assembled Monolayers for Electronic Devices and Patterns | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.wosid | 000369115800157 | - |
dc.identifier.scopusid | 2-s2.0-84989950296 | - |
dc.identifier.rimsid | 22338 | ko |
dc.date.tcdate | 2018-10-01 | - |
dc.contributor.affiliatedAuthor | Bin Wang | - |
dc.contributor.affiliatedAuthor | Ming Huang | - |
dc.contributor.affiliatedAuthor | Sun Hwa Lee | - |
dc.contributor.affiliatedAuthor | Bao-Wen Li | - |
dc.contributor.affiliatedAuthor | Rodney S. Ruoff | - |
dc.identifier.doi | 10.1021/acsnano.5b06842 | - |
dc.identifier.bibliographicCitation | ACS NANO, v.10, no.1, pp.1404 - 1410 | - |
dc.citation.title | ACS NANO | - |
dc.citation.volume | 10 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 1404 | - |
dc.citation.endPage | 1410 | - |
dc.date.scptcdate | 2018-10-01 | - |
dc.description.wostc | 24 | - |
dc.description.scptc | 24 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | FIELD-EFFECT TRANSISTORS | - |
dc.subject.keywordPlus | CHEMICAL-VAPOR-DEPOSITION | - |
dc.subject.keywordPlus | CVD-GROWN GRAPHENE | - |
dc.subject.keywordPlus | ELECTROCHEMICAL DELAMINATION | - |
dc.subject.keywordPlus | HIGH-QUALITY | - |
dc.subject.keywordPlus | TRANSPORT | - |
dc.subject.keywordPlus | TRANSPARENT | - |
dc.subject.keywordPlus | METAL | - |
dc.subject.keywordAuthor | graphene | - |
dc.subject.keywordAuthor | self-assembled monolayer | - |
dc.subject.keywordAuthor | transfer | - |
dc.subject.keywordAuthor | support-free | - |
dc.subject.keywordAuthor | ultrasmooth | - |
dc.subject.keywordAuthor | GFET | - |
dc.subject.keywordAuthor | pattern | - |