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Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets

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Title
Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets
Author(s)
Alex Belianinov; Rama Vasudevan; Evgheni Strelcov; Chad Steed; Sang Mo Yang; Alexander Tselev; Stephen Jesse; Michael Biegalski; Galen Shipman; Christopher Symons; Albina Borisevich; Rick Archibald; Sergei Kalinin
Subject
Scanning probe microscopy, ; Multivariate statistical analysis, ; High-performance computing
Publication Date
2015-05
Journal
Advanced Structural and Chemical Imaging , v.2015, pp.1 - 25
Publisher
Springer
Abstract
The development of electron and scanning probe microscopies in the second half of the twentieth century has produced spectacular images of the internal structure and composition of matter with nanometer, molecular, and atomic resolution. Largely, this progress was enabled by computer-assisted methods of microscope operation, data acquisition, and analysis. Advances in imaging technology in the beginning of the twenty-first century have opened the proverbial floodgates on the availability of high-veracity information on structure and functionality. From the hardware perspective, high-resolution imaging methods now routinely resolve atomic positions with approximately picometer precision, allowing for quantitative measurements of individual bond lengths and angles. Similarly, functional imaging often leads to multidimensional data sets containing partial or full information on properties of interest, acquired as a function of multiple parameters (time, temperature, or other external stimuli). Here, we review several recent applications of the big and deep data analysis methods to visualize, compress, and translate this multidimensional structural and functional data into physically and chemically relevant information. © 2015 Belianinov et al.; licensee Springer. This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly credited.
URI
https://pr.ibs.re.kr/handle/8788114/2353
DOI
10.1186/s40679-015-0006-6
ISSN
2198-0926
Appears in Collections:
Center for Correlated Electron Systems(강상관계 물질 연구단) > 1. Journal Papers (저널논문)
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